Intel Corporation

Oguz Ergin

Xavier Vera

Osman Unsal

Antonio González

Jaume Abella

Antonio Gonzalez

Ilker Polat

Fahrettin Koc

Disclosed is an adaptive application of bias voltages to the access transistors in the cells in dynamic random access memory (DRAM) structures, according to the access pattern of the rows, in other words, whether the rows are accessed and/or how often rows are accessed.

Dynamic random access memory (DRAM) structure with body bias voltage that can be adapted to the access pattern of cells

Disclosed are hardware configurations of the Register Aliasing Table (RAT) which are suitable for use in structures such as modern microprocessor, microcontroller, CPU etc. that use pipe line technique, perform multi-command operations, prevents Write After Read (WAR), Write After Write (WAW), Read After Write (RAW) dependencies. The Register Aliasing Table provides a circuit which consumes less energy, uses less space and has low latency compared to the applications in the state of the art.

One direction-shift register aliasing table circuit suitable for use in microprocessors

In one embodiment, the present invention includes a method for determining a vulnerability level for an instruction executed in a processor, and re-executing the instruction if the vulnerability level is above a threshold. The vulnerability level may correspond to a soft error likelihood for the instruction while the instruction is in the processor. Other embodiments are described and claimed.

Detecting soft errors via selective re-execution

The present invention includes a method for obtaining dynamic operating parameter information of a semiconductor device such as a processor, determining dynamic usage of the device, either as a whole or for one or more portions thereof, based on the dynamic operating parameter information, and dynamically estimating a remaining lifetime of the device based on the dynamic usage. Depending on the estimated remaining lifetime, the device may be controlled in a desired manner.

Dynamically estimating lifetime of a semiconductor device

In one embodiment, the present invention includes a method for identifying available cores of a many-core processor, allocating a first subset of the cores to an enabled state and a second subset of the cores to a spare state, and storing information regarding the allocation in a storage. The allocation of cores to the enables state may be based on a temperature-aware algorithm, in certain embodiments. Other embodiments are described and claimed.

Enhancing reliability of a many-core processor

Methods and apparatus to provide a clustered variations-aware architecture are described. In one embodiment, one or more variations within a clock domain are detected and utilized to adjust a clock signal of the clock domain.

Clustered variations-aware architecture

Embodiments of apparatuses and methods for reducing the soft error vulnerability of stored data are disclosed. In one embodiment, an apparatus includes storage logic, determination logic, and selection logic. The determination logic is to determine a condition of a dataword. The storage logic includes logic to store a first portion of the dataword, a second portion of the dataword, and a result generated by the determination logic. The selection logic is to select, based on the contents of the storage logic to store the result, either the contents of the storage logic to store the second portion of the dataword, or a replacement value. The replacement value depends on the contents of a predetermined bit of the storage logic to store the first portion of the dataword.

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Ankara, Turkey

Oguz Ergin