International Business Machines Corporation

Normand Cote

David Lewis Gardell

Marc Douglas Knox

Jeffrey Donald Gelorme

Paul M Gaschke

Roger G Gamache, Jr

Paul J Aube

Denis D Turcotte

Krishna Gandhi Sachdev

Sushumna Iruvanti

Mark S Chace

Kathryn C Rivera

George J Lawson

Harbans Singh Sachdev, Legal Representative

G John Lawson

Tuknekah M Noble

Peter J Demko

Liquid compositions containing a specific hindered phenol or a hindered phenol in combination with an aromatic phosphite are provided which are used as a thermal interface between a heatsink and a chip during a test procedure for electronic components which compositions enhance the thermal conductivity between the heatsink and the chip, are easily removed from the heatsink and the chip after the test procedure without any deleterious residue and which allow the use of high temperatures for extended periods during the test procedure without any significant degradation of the composition. A method for using the compositions in electronic component test procedures such as burn-in procedures is also provided.

Enhanced thermo-oxidative stability thermal interface compositions and use thereof in microelectronics assembly

A heat sink for use in the burn-in of an I/C chip, which chip has a generally 'flat' surface. The heat sink has a 'flat' surface with micro-channels therein, positioned to open and close in and out of contact against the flat surface of an I/C chip being burned-in. At least one liquid opening communicates with said essentially flat surface on the heat sink to continuously apply liquid between the heat sink and the chip. A liquid inlet is provided to supply liquid to said at least one liquid opening. A recovery channel is positioned to recover liquid from between the heat sink and the chip, and an exhaust member is provided to carry liquid from said recovery channel to the exterior of the heat sink. The invention also includes a method of burning-in a chip.

Liquid recovery, collection method and apparatus in a non-recirculating test and burn-in application

A method, system and apparatus for testing an integrated circuit chip. The system including: means for forming a liquid polyalphaolefine layer on a bottom surface of the integrated circuit chip, a top surface of the integrated circuit chip having and a bottom surface not having signal and power pads; means for placing a surface of a heat sink into physical contact with the bottom surface of the polyalphaolefine layer; means for electrically coupling the integrated circuit chip to a tester; means for electrically testing the integrated circuit chip; means for electrically de-coupling the integrated circuit chip from the tester; means for removing the heat sink from contact with the polyalphaolefine layer, all or a portion of the polyalphaolefine layer remaining on the bottom surface of the integrated circuit chip; and means for removing the polyalphaolefine layer from the bottom surface of the integrated circuit chip.

Apparatus for temporary thermal coupling of an electronic device to a heat sink during test

A method, system and apparatus for testing an electronic device. The method including: (a) forming a temporary liquid heat transfer layer on a surface of the electronic device; after step (a), (b) placing a surface of a heat sink into physical contact with a surface of the heat transfer layer; after step (b), (c) electrically testing the electronic device; after step (c), (d) removing the heat sink from contact with the heat transfer layer; and after step (d), (e) removing any heat transfer layer remaining on the electronic device from the surface of the electronic device.

Method and apparatus for temporary thermal coupling of an electronic device to a heat sink during test

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Normand Cote