Ametek, Inc.

Norman Kupzak

James A Salomon

Andre Stark

Max Fredrich

Devices, methods, and non-transitory computer readable media for measuring properties of a material are disclosed. A device is configured to automatically identify a property of the material such as a surface of the material as a measuring head of a spindle engages the material as the spindle is lowered. After the material surface is identified, the device is configured to automatically lower the measuring head to a predefined depth within the material with respect to the material surface. The device may measure another property of the material such as a rheological property with the measuring head at the predefined depth. The device may change the depth of the measuring head during measurement of the rheological property.

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Dresden, Germany

Norman Kupzak