International Business Machines Corporation

Norman Karl James

Michael Stephen Floyd

Joshua D Friedrich

William Vincent Huott

Malcolm Scott Ware

Phillip John Restle

Soraya Ghiasi

Robert Benjamin Gass

Benjamin Nowak

Harold Wayne Chase

Mark W Vanderwiele

Daniel Mark Dreps

James Stephen Fields, Jr

David William Boerstler

Edmund Juris Sprogis

Frank David Ferraiolo

Gary Dale Carpenter

Kevin Franklin Reick

Alan J Drake

Michael John Hamilton

Andrew J Geissler

Timothy Michael Skergan

Seongwon Kim

Christopher John Engel

Robert Matthew Senger

Robert Louis Franch

Pradip Patel

Larry Scott Leitner

Daniel Rodko

Huajun Wen

Steven Paul Hartman

Bradley David McCredie

Philip George Shephard, Iii

James Douglas Jordan

Scott Leonard Daniels

Brian Chan Monwai

Carl J Anderson

Hector Saenz

Jeffrey W Kellington

Jason T Albert

Timothy J Eby

Harmander Singh Deogun

Richard L Willaman

John R Ripley

Arnold E Barish

Daniel Eugene Pridgeon

Jagat V Pokala

William T Bronk

Marco Zamora

Joshua David Friedrich

Aspects include a computer-implemented method for scanning data into a shift register. The method includes receiving, by a circuit, a data signal, wherein the data signal propagates in a first direction; and receiving, by the circuit, a clock signal, wherein the clock signal propagates in a second direction, wherein the second direction is in a reverse direction of the first direction.

Shift register with opposite shift data and shift clock directions

A computing node includes at least one hardware layer comprising a plurality of hardware resources and at least one virtualization layer operative to manage at one virtual machine defined by at least one resource from among the plurality of hardware resources. The computing node includes load balancing interrupt logic configured in the hardware layer of the node. The load balancing interrupt logic is operative to compare at least one resource utilization level of the plurality of hardware resources by the at least one virtual machine with at least one threshold. The load balancing interrupt logic is operative to generate at least one load balancing interrupt indicating at least one load balancing status of the computing node based on the comparison of the at least one resource utilization level with the at least one threshold.

Hardware level generated interrupts indicating load balancing status for a node in a virtualized computing environment

A voltage regulator module (VRM) includes a first interface configured to couple to a first substrate interface at a first voltage. The VRM also includes a second interface configured to couple to a first processor interface at a second voltage. A first regulator module couples to the first interface and to the second interface. The first regulator module is configured to receive power at the first interface, to convert power to the second voltage, and to deliver power to the first processor interface at the second voltage. A method for providing power to a processor includes receiving power from a first substrate interface at a first voltage. The received power is regulated to generate power at a second voltage. The regulated power is provided to a processor at a first processor interface coupled to the processor. The processor interface delivers power to a logic group of a plurality of logic groups of the processor.

Processor voltage regulation

During manufacture, an operating range for dynamic voltage and frequency scaling can be established. A nominal operating point is identified based on a design nominal operating frequency for a computer processor. The nominal operating point comprises a nominal operating voltage identified for the design nominal operating frequency. In dependence upon the nominal operating point, an operating range of frequency and voltage over which the computer processor is to function is determined. Information specifying the nominal operating point and the operating range is stored in non-volatile storage associated with the computer processor.

Establishing an operating range for dynamic frequency and voltage scaling

A mechanism is provided for internally controlling and enhancing advanced test and characterization in a multiple core microprocessor. To decrease the time needed to test a multiple core chip, the mechanism uses micro-architectural support that allows one core, a control core, to run a functional program to test the other cores. Any core on the chip can be designated to be the control core as long as it has already been tested for functionality at one safe frequency and voltage operating point. An external testing device loads a small program into the control core's dedicated memory. The program functionally running on the control core uses micro-architectural support for functional scan and external scan communication to independently test the other cores while adjusting the frequencies and/or voltages of the other cores until failure. The control core may independently test the other cores by starting, stopping, and determining pass/fail results.

Internally controlling and enhancing advanced test and characterization in a multiple core microprocessor

A mechanism is provided for internally controlling and enhancing logic built-in self test in a multiple core microprocessor. The control core may use architectural support for scan and external scan communication (XSCOM) to independently test the other cores while adjusting their frequency and/or voltage. A program loaded onto the control core may adjust the frequency and configure the LBIST to run on each of the cores under test. Once LBIST has completed on a core under test, the control core's program may evaluate the results and decide a next test to run for that core. For isolating failing latch positions, the control core may iteratively configure the LBIST mask and sequence registers on the core under test to determine the location of the failing latch. The control core may control the LBIST stump masks to isolate the failure to a particular latch scan ring and then position within that ring.

Internally controlling and enhancing logic built-in self test in a multiple core microprocessor

A benchmark tester retrieves a voltage margin that corresponds to a device that a system includes. The voltage margin indicates an additional amount of voltage to apply to a nominal voltage that, when added, results in the device operating at a power limit while executing a worst-case power workload. Next, the benchmark tester (or thermal power management device) sets an input voltage for the device to a value equal to the sum of the voltage margin and the nominal voltage. The benchmark tester then dynamically benchmark tests the system, which includes adjusting the device's frequency and input voltage while ensuring that the device does not exceed the device's power limit. In turn, the benchmark tester records a guaranteed minimum performance boost for the system based upon a result of the benchmark testing.

Identifying deterministic performance boost capability of a computer system

Exemplary embodiments provide a computer-implemented method and a system for a startup cycle for a cycle deterministic start. An initializing mechanism applies power to a microprocessor. The initializing mechanism initializes the configuration of the microprocessor. The initializing mechanism initializes a timer. The initializing mechanism then sends a clock start command to the microprocessor. The clocks on the microprocessor are started. Upon the clocks starting, the timer begins and allows temporary transients, such as voltage droop due to a large instantaneous change in demand for current due to the commencement of clock switching. Responsive to the timer reaching a target value, an interrupt unit sends a system reset interrupt. Responsive to the interrupt unit sending the system reset interrupt, an instruction fetch unit fetches a first instruction. This operation will be deterministic to the state of the rest of the microprocessor memory elements (latches, arrays, et al.).

Method and apparatus to avoid power transients during a microprocessor test

Sensors on the integrated circuit are used to detect the current operating state of the chip, such as frequency, voltage, temperature characteristics, or variation in the integrated circuit manufacturing process. In response, the integrated circuit may choose to modify operational parameters (such as frequency, voltage, or power-down states) in order to dynamically and autonomously maintain an optimal performance and/or power-efficiency operational point.

Self-learning of the optimal power or performance operating point of a computer chip based on instantaneous feedback of present operating environment

A circuit for dynamically monitoring the operation of an integrated circuit under differing temperature, frequency, and voltage (including localized noise and droop), and for detecting early life wear-out mechanisms (e.g., NBTI, hot electrons).

Circuit for dynamic circuit timing synthesis and monitoring of critical paths and environmental conditions of an integrated circuit

A method of and a system for testing semiconductor devices heat a plurality of devices to a burn-in temperature, and perform functional tests in parallel on the plurality of devices at the burn-in temperature. Systems include a burn-in oven and a test multiplexer. The burn-in oven is adapted to receive and heat the devices to the burn-in temperature. The test multiplexer is adapted to apply functional test signals to and receive output signals from the devices in the burn-in oven.

Method of and system for functionally testing multiple devices in parallel in a burn-in-environment

A circuit for measuring timing uncertainty in a clocked digital path and in particular, the number of logic stages completed in any clock cycle. A local clock buffer receives a global clock and provides a complementary pair of local clocks. A first local (launch) clock is an input to a delay line, e.g., 3 clock cycles worth of series connected inverters. Delay line taps (inverter outputs) are inputs to a register that is clocked by the complementary clock pair to capture progression of the launch clock through the delay line and identify any variation (e.g., from jitter, VDD noise) in that progression. Global clock skew and across chip gate length variation can be measured by cross coupling launch clocks from a pair of such clock buffers and selectively passing the local and remote launch clocks to the respective delay lines.

Built in self test circuit for measuring total timing uncertainty in a digital data path

A digitally tunable low voltage CMOS current reference is disclosed. A tunable current reference circuit is provided that includes a current source circuit that is coupled to a power supply voltage. The current source circuit provides a stable current reference output regardless of fluctuations in the power supply voltage. Multiple digitally selectable inputs are included in the current reference circuit and are coupled to the current source circuit. These inputs are used to adjust a value of the current reference output.

Digitally tunable high-current current reference with high PSRR

A mechanism is provided to address a structure under test and to identify a point of failure. A test open line carries a signal that indicates whether a structure under test is open or closed. A test short line carries a signal that indicates whether a structure under test is shorted. A test structure may include an array of cells, where each cell includes a circuit including structures to test. The cells may be scanned using scan only latches and signals on the test open and/or test short lines may be recorded. A test circuit may include a digital mode and an analog mode. The digital mode provides an open or closed value. The analog mode includes a programmable load. The output of the analog mode provides a resistance value that is relative to the programmable load.

Defect monitor for semiconductor manufacturing capable of performing analog resistance measurements

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Liberty Hill, TX, United States of America

Norman Karl James