Sysmex Corporation

Noriyoshi Yoshida

Takaaki Nagai

Yoichi Nakamura

Kazutoshi Tokunaga

Kazuyuki Sakurai

Masaharu Shibata

Shuhei Kaneko

Hidenari Takaoka

Yasuhiro Oyama

Takashi Yoshida

Toshikatsu Fukuju

Kouji Kasuya

Shoichiro Asada

Toshihiro Ootani

Eiji Tanoshima

Seido Biwa

Masami Ishizaki

Yasuhiro Ohyama

Toshihiro Kubota

A sample analyzer capable of operating in a first measuring mode for measuring a sample and a second measuring mode for measuring a sample, comprising: a sample provider for providing a sample; a common reagent provider for providing a common reagent used in the first measuring mode and the second measuring mode; a special reagent provider for providing a special reagent used in the second measuring mode; a mode selector for selecting one of the first measuring mode and the second measuring mode; a measuring section for measuring the sample; and wherein in the first measuring mode, the sample provider and the common reagent provider operate so as to make a first mode sample comprising the sample and the common reagent, and the measuring section operates so as to measure the first mode sample, and in the second measuring mode, the sample provider, the common reagent provider and the special reagent provider operate so as to make a second mode sample comprising the sample, the common reagent and the special reagent, and the measuring section operates so as to measure the second mode sample, is disclosed. A sample analyzing method is also disclosed.

Sample analyzer and sample analyzing method

A sample analyzer that includes a sample preparing section operative to aspirate a sample from a sample container and a measuring section operative to prepare a plurality of measurement samples from the aspirated sample. A control unit is configured to sequentially measure the plurality of prepared measurement samples, obtain a plurality of measurement data for the respective measurement samples, and obtain an analysis result of a predetermined item of the sample based on the plurality of measurement data.

Sample analyzer, sample analyzing method, and computer program product

A sample analyzer includes a liquid aspirator to be stuck into the closed container for aspirating a sample from a closed container; a preparing section for preparing an analysis sample using the aspirated sample; and an analyzing section for analyzing the prepared analysis sample; the liquid aspirator including an elongated pipe, the pipe having a liquid flow path extending therein and a plurality of communicating sections provided in an outer surface thereof, at least one of the communicating sections communicating between an inside and an outside of the container when the pipe is stuck into the container.

Sample analyzer and its components

Liquid aspirators are described that include an aspirating pipette; a drive source for descending the aspirating pipette; and a controller for controlling the drive source; the aspirating pipette being stopped from being descended by loss of synchronism of the drive source caused by upward force to be exerted on the aspirating pipette. Analyzers are also described.

Liquid aspirator and analyzer provided with same

An automatic sample analyzer includes: a pipette, a pipette driving device which moves the pipette to a sample vessel present in a predetermined position to cause the pipette to suck up a sample from the sample vessel, and then moves the pipette to an open vessel provided in another predetermined position to cause the pipette to discharge the sample into the open vessel, and an analyzing section for analyzing the discharged sample, the pipette driving device comprising a vertically movable main arm and an elongated guide arm cantilevered by the main arm and extending horizontally, the guide arm having a smaller flexural rigidity than the main arm, wherein the main arm vertically moves the pipette when the sample is to be sucked up from the sample vessel, and the guide arm guides the pipette to the open vessel and then vertically moves the pipette when the sample is to be discharged into the open vessel.

Automatic sample analyzer and its components

Sample analyzer

Vessel

Inner cap for a vessel

Growing community of inventors

Kobe, Japan

Noriyoshi Yoshida