Ihi Corporation

Noriyoshi Mizukoshi

Hatsuo Mori

Takashi Ogai

Keisuke Suzuki

Takayuki Yamamoto

Yusuke Maru

Satoshi Nonaka

Tsuyoshi Yagishita

Shinsuke Takeuchi

An abnormality determination device according to one aspect of the present disclosure is an abnormality determination device that determines an abnormality of an inducer used for a pump, the abnormality determination device including a stress-response acquisition unit that acquires a stress response indicating a temporal change in stress applied to the inducer, an accumulated-fatigue-damage-degree calculation unit that calculates an accumulated fatigue-damage degree of the inducer based on the stress response, a lifetime-consumption-rate calculation unit that calculates a lifetime consumption rate that is a changing rate of the accumulated fatigue-damage degree with respect to time, and a determination unit that determines an abnormality of the inducer based on the accumulated fatigue-damage degree and the lifetime consumption rate, in which the inducer is used only for a predetermined use time per operation of the pump.

Abnormality determination device and abnormality determination method

An abnormality diagnosing method includes a model generation step of generating a simulation model of a monitoring target, an operation start step of starting an operation of the monitoring target, a measurement step of measuring an internal state quantity in the operating state of the monitoring target and extracting a measured value, a prediction step of inputting into the simulation model same control input value used in the operating state of the monitoring target and calculating a predicted value of the internal state quantity of the monitoring target, a Mahalanobis distance calculation step of calculating a Mahalanobis distance from a difference between the measured value and the predicted value, and an abnormality diagnosis step of diagnosing whether the operating state of the monitoring target is abnormal based on the Mahalanobis distance.

Abnormality diagnosing method and abnormality diagnosing system

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Koto-ku, Japan

Noriyoshi Mizukoshi