Kabushiki Kaisha Toshiba

Toshiba Memory Corporation

Kioxia Corporation

Noriyasu Kumazaki

Masashi Yamaoka

Akio Sugahara

Yuzuru Shibazaki

Bushnaq Sanad

Yuri Terada

Junichi Sato

Norichika Asaoka

Takaya Handa

Kazuto Uehara

Ryosuke Isomura

Sanad Bushnaq

Shigeo Ohshima

Masahiro Yoshihara

Keiji Maruyama

Masafumi Uemura

Yasufumi Kajiyama

Masaru Koyanagi

Koji Kato

Yoshihiko Kamata

Akira Umezawa

Yasuhiko Honda

Mario Sako

Susumu Fujimura

Kazuaki Kawaguchi

Tatsuro Midorikawa

Daisuke Arizono

Mami Kakoi

Jun Fujimoto

A memory device includes a memory cell array, a voltage generation circuit generating one or more voltages supplied to the memory cell array, an input/output circuit receiving an address indicating a region in the memory cell array, and a control circuit controlling operations of the memory cell array. The control circuit supplies a non-selection voltage of the voltages before a ready/busy signal changes from a ready state to a busy state.

Memory device which generates operation voltages in parallel with reception of an address

According to one embodiment, a semiconductor storage device includes a first memory string including a first memory transistor, a first word line connected to a gate electrode of the first memory transistor, a source line connected to one end of the memory string, and a first connection transistor connected between the first word line and the source line.

Semiconductor storage device

A semiconductor memory device includes memory cell arrays including a first memory cell and a first word line connected to the first memory cell, a first wiring electrically connected to the first word lines corresponding to the memory cell arrays, a driver circuit electrically connected to the first wiring, second wirings electrically connected to the first wiring via the driver circuit, a voltage generation circuit including output terminals disposed corresponding to the second wirings, and first circuits disposed corresponding to the memory cell arrays. The voltage generation circuit is electrically connected to the first word lines via a first current path including the second wirings, the driver circuit, and the first wiring. The voltage generation circuit is electrically connected to the first word lines via a second current path including the second wirings and the first circuits and without including the driver circuit.

Semiconductor memory device for reducing effect of leakage current

A memory device includes a memory cell array, a voltage generation circuit generating one or more voltages supplied to the memory cell array, an input/output circuit receiving an address indicating a region in the memory cell array and a control circuit controlling operations of the memory cell array. The voltage generation circuit generates the voltages before a ready/busy signal changing from a ready state to a busy state.

A method of controlling a memory device includes receiving an address indicating a region in a memory cell array and generating one or more voltages supplied to the memory cell array in parallel with receiving the address.

According one embodiment, a memory device includes: a memory cell array; a voltage generation circuit generating one or more voltages supplied to the memory cell array; an input/output circuit receiving an address indicating a region in the memory cell array; and a control circuit controlling operations of the memory cell array. The voltage generation circuit generates the voltages during reception of the address.

A semiconductor storage device includes a memory cell array, a temperature sensor configured to generate a first temperature signal corresponding to a temperature of the memory cell array in response to a first command periodically generated during a waiting period of the memory cell array, a storage circuit configured to store the first temperature signal and update the first temperature signal each time the first command is generated during the waiting period, and a voltage generation circuit configured to generate a voltage to be applied to the memory cell array based on the first temperature signal stored in the storage circuit.

Semiconductor storage device having a temperature sensor that generates a temperature signal based on which applied voltages are generated

According to one embodiment, a semiconductor memory device includes: a memory cell array including a first memory cell, a first word line, a first circuit coupled to the first word line, a first driver used for a write operation and a read operation, a second driver used for an erase operation, and a voltage generator. The first circuit includes: a second circuit capable of electrically coupling the first word line and a first interconnect; a third circuit capable of electrically coupling the first interconnect and a second interconnect; a fourth circuit capable of electrically coupling the second interconnect and the first driver in the write and read operations; and a fifth circuit capable of electrically coupling the second interconnect and the second driver in the erase operation.

Semiconductor memory device

A semiconductor memory device includes a plurality of blocks of memory cells, including first, second, and third blocks of a first group of blocks and fourth fifth and sixth blocks of a second group of blocks, a plurality of word lines for each of the blocks, a first decode circuit for the first group, and a second decode circuit for the second group. When the first block is selected, the first decode circuit transfers a first voltage to the word lines of the first block, transfers a second voltage lower than the first voltage to the word lines of the second block, and causes the word lines of the third block to go into an electrically floating state, and the second decode circuit causes the words lines of the fourth block, the fifth block, and the sixth block into the electrically floating state.

Semiconductor memory device for providing different voltages to grouped memory blocks

A semiconductor storage device according to the present embodiment includes a memory cell array including a plurality of memory cells. A plurality of word lines are electrically connected to control gates of the memory cells. A plurality of bit lines are electrically connected to one end of a current path of the memory cells. A sense amplifier part detects data stored in the selected memory cells. A power supply part converts an external power supply voltage to an internal power supply voltage and supplies the internal power supply voltage to the sense amplifier part. A power supply wire extends above the memory cell array and is provided to range from the power supply part to the sense amplifier part.

A semiconductor device includes an input-part receiving a first voltage and an output-part outputing a second voltage. A current mirror part receives the first voltage. A reference voltage is supplied to a gate of a reference transistor. The reference transistor is electrically connected between the current-mirror part and a ground voltage. A monitor transistor includes a gate electrically connected to the second power-supply voltage, and is electrically connected between the current-mirror part and the ground voltage. A voltage-generation transistor includes a gate electrically connected to both the current-mirror part and the reference transistor. The voltage-generation transistor is electrically connected between the input-part and the output-part. A first capacitor including one end electrically connected to the output-part, and the other end electrically connected to both the current-mirror part and the reference transistor.

Semiconductor device

A voltage generating circuit includes first and second step-up circuits, each having first and second input terminals and an output terminal and configured to increase a voltage level of an input signal supplied through the first input terminal and output the signal with the increased voltage level through the output terminal. The second input terminal of the first step-up circuit is connected to the output terminal of the second step-up circuit and the second input terminal of the second step-up circuit is connected to the output terminal of the first step-up circuit. The voltage generating circuit may also include third and fourth step-up circuits and fifth and sixth step-up circuits having similar configurations.

Voltage generating circuit and semiconductor device including the voltage generating circuit

According to one embodiment, a semiconductor memory device includes a memory cell array, a first detecting circuit, a second detecting circuit, a switching circuit and a recovery control circuit. The first detecting circuit outputs a first detection signal which shows whether an externally supplied external power supply is equal to or more than a first voltage. The second detecting circuit outputs, at a higher speed than the first detecting circuit, a second detection signal which shows whether the external power supply is equal to or more than the first voltage. In a write operation, the switching circuit outputs the second detection signal output from the second detecting circuit. In an operation other than the write operation, the switching circuit outputs the first detection signal output from the first detecting circuit. The recovery control circuit terminates the write operation according to the second detection signal output from the switching circuit.

Growing community of inventors

Kawasaki, Japan

Noriyasu Kumazaki