Nippon Telegraph and Telephone Corporation

The Furukawa Electric Co., Ltd.

National Institute of Advanced Industrial Science and Technology

Mitsubishi Electric Corporation

Canon Kabushiki Kaisha

Norio Matsui

Kiyoshi Yamamoto

Masashi Yagi

Hideyuki Hatakeyama

Toshiaki Amano

Toshiya Kumagai

Tsutomu Ishida

Masakazu Matsui

Takaaki Manabe

Shinya Yasunaga

Kengo Nakao

Mitsugu Sohma

Hajime Kasahara

Naoto Edo

Yutaka Egawa

Takaaki Osaki

Jin Liu

Takaaki Osaka

Shinichi Susaki

Shinichi Sasaki

An oxide superconducting thin film includes a substrate, and an intermediate layer and a superconducting layer provided in this order on the substrate. The intermediate layer has an average thickness of from 10 nm to 20 nm and a surface roughness Ra of 0.5 nm or less. The superconducting layer is formed on a surface of the intermediate layer and includes an oxide superconductor as a main component. A superconducting fault current limiter including the oxide superconducting thin film is also provided.

Oxide superconductor thin film and superconducting fault current limiter

A robot control apparatus, which causes a robot to use its hand to grasp and move a workpiece detected by a workpiece detection unit, has a storage unit and a control unit. A non-interference area in which no interference occurs between the hand and a surrounding environment and a work area through which the hand potentially passes when grasping the workpiece are stored as a parameter in the storage unit. The control unit computes, based on a position and an attitude of the detected workpiece and the parameter regarding the work area, a position and an orientation of the work area with reference to the position of the detected workpiece. Moreover, the control unit computes an overlap between a surrounding environment area excluding the non-interference area and the work area having the computed position and orientation. If there is the overlap, the control unit executes a predetermined operation.

Robot control apparatus

An oxide superconducting thin film includes a substrate having a single crystal structure, the main face of the substrate and a crystal face of the single crystal structure having an angle therebetween; an intermediate layer formed on the main face of the substrate and having an axis oriented in a direction perpendicular to the crystal face; and a superconducting layer formed on the intermediate layer and containing, as a main component, an oxide superconductor having a c-axis oriented in a direction perpendicular to the surface of the intermediate layer. A superconducting fault current limiter and a method of manufacturing an oxide superconducting thin film are also provided.

Oxide superconductor thin film, superconducting fault current limiter, and method for manufacturing oxide superconductor thin film

A stack layer structure is formed wherein solderable metal layers are provided at least at two ends thereof, and at least a metal layer for preventing the diffusion of solder is inserted between the two metal layers. In an interboard connection terminal and a method of manufacturing the same, a pair of solder bumps are fixed to be in contact with the two surfaces of the resultant stack layer structure.

Method of manufacturing an interboard connection terminal

Interboard connection terminal and method of manufacturing the same

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Tokyo, Japan

Norio Matsui