Hitachi High-tech Corporation

Noriko Ebine

Satoshi Takahashi

Akira Masuya

Provided is a particle quantitative measurement device according to which the number of particles that can be accurately recognized in a particulate sample has a wider range. An observation devicecomprises a computerand an imaging camerafor acquiring a sample image representing the particulate sample. As an extraction unit, the computerextracts a low-brightness pixel for which I<M−kσ is satisfied for brightness I from pixels of the sample image. Here, M represents brightness for a reference image, k represents a real positive number, and σ represents a standard deviation for the brightnesses of the pixels in the reference image. The computeralso functions as a particle recognition unit or a particle quantitative measurement unit and quantitatively measures the particulate sample on the basis of the low-brightness pixel.

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Tokyo, Japan

Noriko Ebine