Jeol Ltd.

Mitsubishi Heavy Industries Limited

Norihisa Mori

Naoki Kato

Shinya Fujita

Shigeru Honda

Masaru Takakura

Naoki Katoh

Naoyuki Kamishima

Shuichi Sakamoto

Masaki Morita

An image processing device includes a spectrum acquisition unit that acquires a plurality of spectra that respectively have different measurement energy ranges and energy resolutions and are acquired using an X-ray spectrometer having a plurality of dispersion elements with different spectral characteristics, a graph generation unit that sets the plurality of spectra on a single graph having an axis of an aroot of the energy (where a&#x2265;2) as a first axis, and an axis based on an X-ray intensity as a second axis, and a display control unit that executes control to display the graph generated by the graph generation unit on a display unit.

Image processing device, analysis device, and image processing method for generating an X-ray spectrum

An image processing apparatus including a processor and a memory, the processor executing a program stored in the memory to: acquire elemental map data representing a distribution of X-ray intensity or a distribution of concentration for each element; generate a phase map indicating a distribution of phases of compounds based on the elemental map data; and generate graphs representing X-ray intensity of each element or a concentration of each element as an area for the respective phases of the compounds included in the phase map and cause a display section to display the graphs.

Image processing apparatus, surface analyzer, and image processing method

Provided is an image processing apparatus, which is configured to perform smoothing processing on a mapping image obtained by detecting a signal emitted from one of a plurality of analysis areas of a specimen. The image processing apparatus includes: a memory; and a processor configured to execute a program stored in the memory to perform: processing for calculating a difference between a maximum value and a minimum value of signal intensity data being intensity information on the signal of one of pixels within the mapping image, and determining a degree of smoothing to be used for the smoothing processing based on the difference; and processing for performing the smoothing processing based on the determined degree of smoothing.

Image processing apparatus, image processing method, and analyzer

A scatter diagram display device includes a principal component analysis section that performs principal component analysis on intensity or concentration map data that represents each element, a priority level setting section that sets a priority level to each element based on the results of the principal component analysis performed by the principal component analysis section, and a display control section that performs a control process that arranges a plurality of scatter diagrams generated by combining each element based on the priority level that has been set to each element by the priority level setting section, and displays the plurality of scatter diagrams on a display section.

Scatter diagram display device and surface analyzer

A phase analyzer includes a principal component analysis section that performs principal component analysis on elemental map data that represents an intensity or concentration distribution corresponding to each element to calculate a principal component score corresponding to each unit area of the elemental map data, a scatter diagram generation section that plots the calculated principal component score to generate a scatter diagram of the principal component score, a peak position detection section that detects a peak position from the scatter diagram, a clustering section that calculates a distance between each point and each peak position within the scatter diagram, and classifies each point within the scatter diagram into a plurality of groups based on the distance, and a phase map generation section that generates a phase map based on classification results of the clustering section.

Phase analyzer, phase analysis method, and surface analyzer

A radioactive iodine removal apparatus applying a radioactive iodine adsorbent according to an embodiment of the present invention includes an iodine filter that is provided in a chamber of a duct to which flue gas containing radioactive iodine is fed, and includes a radioactive iodine adsorbent that adsorbs radioactive iodine contained in the flue gas. The radioactive iodine adsorbent includes a carrier constituting a matrix and an impregnated substance with which the carrier is impregnated. The impregnated substance contains at least TEDA, and an impregnated amount of the TEDA is from 3.0% by mass to less than 10.0% by mass.

Radioactive iodine adsorbent and radioactive iodine removal apparatus

A leak testing device for an iodine filter according to the present embodiment includes an iodine adsorption unit including an iodine filter provided in a chamber provided in a duct, to which flue gas containing radioactive iodine is fed, and including an iodine adsorbing material that adsorbs radioactive iodine contained in the flue gas, a fluorine-containing-reagent feed unit that feeds a fluorine-containing reagent that does not contain chlorine into the duct, and a first fluorine-containing-reagent-concentration measurement unit and a second fluorine-containing-reagent-concentration measurement unit that measures a concentration of the fluorine-containing reagent on an upstream side and a downstream side of the iodine filter.

Leak testing method and leak testing device for iodine filter

An electron beam system (such as a scanning electron microscope or an electron probe microanalyzer) capable of displaying backscattered electron (BSE) images at the same brightness and same contrast at all times if the atomic number differences are the same when illumination conditions including accelerating voltage and emission current are varied or when the specimens are imaged with different instruments.

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Tokyo, Japan

Norihisa Mori