Omron Corporation

Norihiro Tomago

Yusuke Iida

Kiyoshi Imai

Takahiro Suga

Hiroaki Takimasa

Tomonori Kondo

Kenichi Matoba

Kosuke Sugiyama

Shinya Furukawa

Kohei Tanisue

Yusuke Shibasaki

Provided are a photoelectric sensor and a threshold setting method. The photoelectric sensor is a photoelectric sensor detecting an object and includes a light reception part, an object determination part, and a setting part. The light reception part receives light to obtain a light reception amount. The object determination part determines presence/absence of the object based on the light reception amount and a threshold. The setting part sets the threshold based on the light reception amount during a period in which it has been determined that the object is present and the light reception amount during a period in which it has been determined that the object is absent.

Photoelectric sensor and threshold setting method

The present invention provides a sensor system with which a change in the state of a workpiece which has occurred in a conveyance process can be detennined. The sensor system comprises: a plurality of sensors positioned along a line and measuring data indicating that a workpiece being conveyed upon the line has passed thereby; a plurality of slave units respectively connected to the plurality of sensors and acquiring the data measured by the plurality of sensors; and a master unit connected to the plurality of slave units. The master unit comprises: a storage part for storing the data in association with information which relates to the timing at which the data was measured; and a determination part for comparing the data transmitted from two or more of the plurality of slave units using the information which relates to the timing, and determining a change in the state of the workpiece.

Sensor system

Provided is an inclination measuring device with excellent convenience. An inclination measuring device includes: an optical system (sensor head) configured to irradiate a measurement object with an irradiated light ray from a light source and receive a reflected light ray from a measurement surface; a light receiving unit including at least one spectroscope configured to separate the reflected light ray into wavelength components, and a detector in which a plurality of light receiving elements are disposed; a light guide including a plurality of cores; and a processor configured to calculate an inclination angle of the measurement surface based on reflected light rays with respect to a plurality of irradiated light rays with which a plurality of positions on the measurement surface are irradiated.

Inclination measuring device

An optical sensor and an abnormality detection method therefor are provided. The optical sensor includes a light source device that generates light to be irradiated to an object; a light receiving part that receives a reflected light from the object; a branch part that fuses a first optical fiber optically coupled to the light source device and a second optical fiber optically coupled to the light receiving part to join with one end of a third optical fiber facing the object; and a processing part that determines whether junction abnormality occurs at a junction between the third optical fiber and the branch part based on whether an increment in a received light amount detected by the light receiving part with respect to a reference detection amount which is detected in a state of no reflection from the other end of the third optical fiber is within a predetermined range.

Optical sensor and abnormality detection method for optical sensor

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Ayabe, Japan

Norihiro Tomago