Infineon Technologies Austria Ag

Norbert Rieser

Thomas Krotscheck Ostermann

Clemens Roessler

Johanna Elisabeth Roessler

Michael Leutschacher

Siegfried Schmid

Walter Slamnig

A device for controlling trapped ions includes a substrate. An electrode structure is disposed on the substrate, the electrode structure including DC electrodes and RF electrodes of an ion trap configured to trap ions in a space above the substrate. A first device terminal is disposed on the substrate, the first device terminal being connected via a first electrode connection line to a specific DC electrode. Further, a second device terminal is disposed on the substrate, the second device terminal being connected via a second electrode connection line to the specific DC electrode.

Device for controlling trapped ions having an electrode circuitry configured for device testing

A probe card with a ground contact, a first contact element and a second contact element is provided. The first contact element is coupled to an interconnection node via a first interconnection line having a definite length and the second contact element is coupled to the interconnection node via a second interconnection line having the same definite length. The interconnection node is directly connected to the ground contact.

Probe card and method for performing an unclamped inductive switching test using multiple equal-length interconnection lines emanating from a common connection node

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Millstatt, Austria

Norbert Rieser