Elmos Semiconductor Ag

Norbert Raehse

Rüdiger Arnold

An apparatus for measuring the capacitance to be measured is proposed. It comprises a first sine-wave oscillator, the measuring oscillator, and a second sine-wave oscillator, the reference oscillator. The frequency of the output signal of the measuring oscillator, hereinafter also referred to as measuring frequency, is dependent on the capacitance to be measured. The frequency of the output signal of the reference oscillator, hereinafter also referred to as reference frequency, is dependent on a reference capacitance. The apparatus comprises a sub-apparatus which produces the ratio of the frequency value of the frequency of the output signal of the reference oscillator and the frequency value of the frequency of the output signal of the measuring oscillator and subsequently squares this ratio to provide the result of this squaring as a measured value.

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Falkensee, Germany

Norbert Raehse