Anton Paar Gmbh

Norbert Pinno-Rath

Daniel Koller

Gernot Leuprecht

A handling apparatus for handling a measuring probe of a scanning probe microscope is disclosed. The measuring probe has a probe body and a probe tip which is coupled with the probe body by a cantilever. The handling apparatus includes a receiving device for receiving the measuring probe at a receiving area, a guide structure, in which the measuring probe is guidable while at the same time the probe body is at least partially limited and the cantilever and the probe tip are supported without contact, and a transport device for transporting the measuring probe from the receiving area along the guide structure to a target area.

Handling device for handling a measuring probe

A holding device for detachably holding a magnetic sample holder or a sample body, in particular for a scanning probe microscope, wherein the holding device includes an accommodation unit for accommodating the magnetic sample holder or the sample body, a magnetic field guiding unit which, in a holding mode, is adapted for guiding a magnetic field for applying a magnetic holding force at the accommodation unit for holding the magnetic sample holder or sample body which is accommodated at the accommodation unit, and a magnetic field switching unit which is adapted for switching between at least two relative arrangements between the magnetic field guiding unit and the magnetic field switching unit, in order to selectively adjust the holding mode or a release mode, wherein in the release mode the magnetic sample holder or sample body is released for being detached from the accommodation unit.

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Graz, Austria

Norbert Pinno-Rath