Growing community of inventors

Moegglingen, Germany

Norbert Kerwien

Average Co-Inventor Count = 3.09

ph-index = 3

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 26

Norbert KerwienMichael Totzeck (2 patents)Norbert KerwienWolfgang Singer (1 patent)Norbert KerwienHans-Juergen Mann (1 patent)Norbert KerwienManfred Maul (1 patent)Norbert KerwienMarkus Hauf (1 patent)Norbert KerwienDavid R Shafer (1 patent)Norbert KerwienUlrich Wegmann (1 patent)Norbert KerwienThomas Engel (1 patent)Norbert KerwienBernhard Geuppert (1 patent)Norbert KerwienDaniel Bublitz (1 patent)Norbert KerwienKarsten Lindig (1 patent)Norbert KerwienAksel Goehnermeier (1 patent)Norbert KerwienMarkus Seesselberg (1 patent)Norbert KerwienStefan Hembacher (1 patent)Norbert KerwienJochen Hetzler (1 patent)Norbert KerwienChristoph Nieten (1 patent)Norbert KerwienHolger Muenz (1 patent)Norbert KerwienEnrico Geissler (1 patent)Norbert KerwienMartin Schriever (1 patent)Norbert KerwienChristoph Menke (1 patent)Norbert KerwienHolger Seitz (1 patent)Norbert KerwienTobias Breuninger (1 patent)Norbert KerwienMatthias Hillenbrand (1 patent)Norbert KerwienThomas Frank (1 patent)Norbert KerwienErsun Kartal (1 patent)Norbert KerwienThomas Trautzsch (1 patent)Norbert KerwienJuergen Huber (1 patent)Norbert KerwienEduard Schmidt (1 patent)Norbert KerwienTorsten Braendle (1 patent)Norbert KerwienMichael Kieweg (1 patent)Norbert KerwienJürgen Huber (0 patent)Norbert KerwienNorbert Kerwien (11 patents)Michael TotzeckMichael Totzeck (57 patents)Wolfgang SingerWolfgang Singer (120 patents)Hans-Juergen MannHans-Juergen Mann (119 patents)Manfred MaulManfred Maul (64 patents)Markus HaufMarkus Hauf (62 patents)David R ShaferDavid R Shafer (50 patents)Ulrich WegmannUlrich Wegmann (44 patents)Thomas EngelThomas Engel (41 patents)Bernhard GeuppertBernhard Geuppert (36 patents)Daniel BublitzDaniel Bublitz (36 patents)Karsten LindigKarsten Lindig (35 patents)Aksel GoehnermeierAksel Goehnermeier (33 patents)Markus SeesselbergMarkus Seesselberg (32 patents)Stefan HembacherStefan Hembacher (29 patents)Jochen HetzlerJochen Hetzler (27 patents)Christoph NietenChristoph Nieten (26 patents)Holger MuenzHolger Muenz (23 patents)Enrico GeisslerEnrico Geissler (22 patents)Martin SchrieverMartin Schriever (20 patents)Christoph MenkeChristoph Menke (17 patents)Holger SeitzHolger Seitz (14 patents)Tobias BreuningerTobias Breuninger (13 patents)Matthias HillenbrandMatthias Hillenbrand (13 patents)Thomas FrankThomas Frank (8 patents)Ersun KartalErsun Kartal (7 patents)Thomas TrautzschThomas Trautzsch (5 patents)Juergen HuberJuergen Huber (3 patents)Eduard SchmidtEduard Schmidt (3 patents)Torsten BraendleTorsten Braendle (1 patent)Michael KiewegMichael Kieweg (1 patent)Jürgen HuberJürgen Huber (0 patent)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Carl Zeiss Ag (4 from 208 patents)

2. Carl Zeiss Sms Ltd. (3 from 83 patents)

3. Tooz Technologies Gmbh (3 from 58 patents)

4. Carl Zeiss Smt Gmbh (1 from 1,407 patents)

5. Carl Zeiss Industrielle Messtechnik Gmbh (1 from 233 patents)


11 patents:

1. 11630306 - Smartglasses, lens for smartglasses and method for generating an image on the retina

2. 11506882 - Method for supporting a user aiming at an object with a telescope

3. 11204498 - Optical element with a fresnel structure, and display device with such an optical element

4. 10247949 - Method for adjusting a display device

5. 9582927 - Multifocal representation device and multifocal representation method for the three-dimensional representation of an object

6. 9516242 - Method and apparatus for image reconstruction

7. 9383190 - Measuring apparatus and method for determining dimensional characteristics of a measurement object

8. 9268124 - Microscope and method for characterizing structures on an object

9. 9134626 - Microscope and microscopy method for space-resolved measurement of a predetermined structure, in particular a structure of a lithographic mask

10. 8617774 - Method and calibration mask for calibrating a position measuring apparatus

11. 8169595 - Optical apparatus and method for modifying the imaging behavior of such apparatus

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12/13/2025
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