Kabushiki Kaisha Nihon Micronics

Nobuyuki Yamaguchi

Satoshi Narita

Hisao Narita

Kenji Sasaki

Yoko Ichinohe

An embodiment of an electrical connecting apparatus comprises a support board, a plate spring arranged on the support board, an attachment device attaching the plate spring to the support board, a block having an attachment surface directing downward, and a flexible circuit board in which a plurality of contactors are arranged. As for the block, the attachment surface for attaching the circuit board is protruded further to the lower side than the support board. The plate spring receives initial load to bring a state where at least a center area for attaching the block is biased toward the upper side. Thus, a good electrical contacting state can be obtained without increasing the overdriving amount.

Electrical connecting apparatus

The present invention provides an electrical connecting apparatus in which no strong stress acts on a coupling portion of an arm portion continuing into a base portion by a moment force acting on the arm portion. A probe sheet comprising a probe sheet main body and a plurality of probes formed to be protruded from one surface of the probe sheet main body is provided. For formation of the arm portion of the probe, a metal material for an arm main body portion continuing into a probe tip portion is deposited on a base table with an approximately uniform height dimension. Also, a metal material for a reinforcing portion constituting an arm portion together with the arm main body portion is deposited at an area on the arm main body portion distanced from the probe tip portion with an approximately uniform height dimension. Further, a metal material for forming a base portion that is connected to at least the reinforcing portion is deposited without covering a step consisting of one end of the reinforcing portion located on the probe tip portion side and the arm main body portion. Thus, the arm portion in which a height dimension at a coupling portion with the base portion is larger than that at another part except the coupling portion is formed.

Electrical connecting apparatus and method for manufacturing the same

The probe card includes a plurality of probes arranged on one surface side of a board. These probes belonging to any one of a first probe group including a plurality of probes contacting respective electrodes in a first electrode row of an electronic device, a second probe group including a plurality of probes contacting respective electrodes in a second electrode row of the electronic device, and a third and fourth probe groups respectively including a plurality of probes contacting respective electrodes in a middle electrode row of the electronic device alternately.

Electronic device probe card with improved probe grouping

An electrical connecting apparatus is used for electrical inspection of a device under test having electrodes each of which a recess is formed on a flat upside. The electrical connecting apparatus is provided with a plurality of probes, each probe including a base portion combined with a probe board, an elastically deformable arm portion extending above the electrodes of the device under test from the base portion along the probe board and at a distance therefrom, and a tip portion projecting from the arm portion in a direction to be away from the probe board. The front end of the tip portion of each probe can abut a flat surface area except the recess on the upside of the electrode in a state that no flexural deformation is caused in the arm portion. The electrical connecting apparatus is used so that, when an overdrive force toward the electrode acts on the probe to cause the arm portion a flexural deformation, the front end of the tip portion can move on the flat surface area without departing from the flat surface area.

Growing community of inventors

Aomori, Japan

Nobuyuki Yamaguchi