International Business Machines Corporation

Purdue Research Foundation

Nobuo Otsuka

Paul Michael Solomon

Jerry M Woodall

Jeremy H Burroughes

Rodney T Hodgson

Alan C Warren

Michael R Melloch

David T McInturff

A doped or undoped photoresponsive material having metallic precipitates, and a PiN photodiode utilizing the material for detecting light having a wavelength of 1.3 micrometers. The PiN photodiode includes a substrate having a first compound semiconductor layer disposed thereon. The PiN photodiode further includes an optically responsive compound semiconductor layer disposed above the first compound semiconductor layer. The optically responsive layer includes a plurality of buried Schottky barriers, each of which is associated with an inclusion within a crystal lattice of a Group III-V material. The PiN device also includes a further compound semiconductor layer disposed above the optically responsive layer. For a transversely illuminated embodiment, waveguiding layers may also be disposed above and below the PiN structure. In one example the optically responsive layer is comprised of GaAs:As. The GaAs:As exhibits a very low room temperature dark current, even under forward bias conditions, and a responsivity to 1.3 micrometer radiation modulated at frequencies greater than 1 GHz.

Method of making a compound semiconductor having metallic inclusions

Compound semiconductor having metallic inclusions and devices fabricated

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West Lafayette, IN, United States of America

Nobuo Otsuka