Sumitomo Wiring Systems, Limited

Nobuhiro Suzuki

Hajime Kawase

Ryotaro Ishikawa

Yutaka Noro

Yutaka Kobayashi

Keiichi Nakamura

Akira Nishino

Yuji Nagano

A female connector (F) has a housing () with a front end and cavities () extend to the front end. Terminal fittings () are mounted in the cavities (). A front wall () is mounted on the front end of the housing () and is formed with tab insertion holes () that can communicate with cavities (). An operable surface (A) is exposed at an end surface of the front wall (). The front wall () can be moved from a full locking position to a partial locking position along the front end of the housing () by pushing this operable surface (A). Portions of the end surface of the front wall () other than the operable surface (A) are covered at least partly by an wall () of the housing () to limit movement of the front wall ().

Apparatus and method for conducting an electrical test on a terminal fitting in a connector

Connector with moving front wall

A testing apparatus ( ) is provided to securely detect a mounting error of a fittable member ( ) on a connector ( ). The testing apparatus ( ) has a testing unit ( ) for detecting an ajar state of the fittable member ( ) on a housing ( ) of a connector ( ). The testing unit ( ) is provided with an elastic contact ( ) for elastically contacting the housing ( ) of the connector I ) along locking direction (Y) in which the fittable member ( ) is locked with the housing ( ). This elastic contact ( ) is provided with a switch ( ) for detecting the ajar state of the fittable member ( ) at a contact position of the elastic contact ( ) with the housing ( ).

Testing unit and a connector testing apparatus using the same

An electrical connection testing device is provided with a connector holder ( ), first and second probe holders ( ) which are successively arranged such that the connector holder ( ) and the second probe holder are movable toward and away from the connector holder ( ). A pushing mechanism ( ) for pushing a receiving surface ( ) of the second probe holder ( ) at the opposite side from the connector holder ( ) is so coupled with the second probe holder ( ) as to be movable toward and away from the second probe holder ( ). The second probe holder ( ) and the connector holder ( ) are moved according to the movement of the pushing mechanism ( ), thereby being positioned at testing positions (P ) where probes ( ) are inserted into testing holes ( ) of a connector (C) from opposite sides or at retracted positions (P ) where the connector can be taken out of a connector holder ( ).

Electrical connection testing device and an electrical connection testing method for terminal fittings accommodated in a connector

Growing community of inventors

Yokkaichi, Japan

Nobuhiro Suzuki