Omron Corporation

Nobuharu Ishikawa

Yusuke Iida

Toru Hosoda

Yuichi Inoue

Hitoshi Oba

Yoshihiro Yamashita

Hayami Hosokawa

Hiroyuki Inoue

Arata Nakamura

Akira Matsui

Koji Shimada

Hirotaka Nakashima

Masahiro Kawachi

Satoru Shimokawa

Kohei Tomita

Takahiro Suga

Naoki Nishimori

Kosuke Sugiyama

Masahiro Kurokawa

Shinji Mizuhata

Norimasa Yamanaka

Yusuke Iiida

To provide a method for manufacturing a plurality of types of illuminating devices having different specifications while reducing cost. A substrate includes a common flexible portion and a plurality of units bendable with respect to the common portion, where the common portion includes a pad that is extended in the horizontal direction in the plane of the drawing and that is arranged for every predefined interval. In the present manufacturing method, a substrate piece is created by cutting the substrate mounted with the light emitting element in a first direction, the common portion in the substrate piece is formed according to the illuminating device to be manufactured, the relative position of the individual portion with respect to the formed common portion is respectively positioned, and the wiring for supplying power to the pad in the substrate piece is formed.

Illuminating device and method for manufacturing thereof

An extension unit provided adjacent to an amp unit comprises a measurement data accumulation memory, a measurement data acquiring part for acquiring measurement data coming through a transmission line and accumulating it in the above memory, a data analyzing part for analyzing an accumulated series of measurement data according to predetermined algorithm, a determining part for determining a data analyzed result, and an output part for outputting a control signal corresponding to a determined result to the outside. A plurality of process programs in which measurement algorithm is segmentalized are incorporated in the extension unit and a process program is selected according to a command from a personal computer and the selected process program is performed in a predetermined order.

Multiple sensor system

In a displacement sensor ( ) comprising a sensor head ( ) and a controller ( ) either integrally or separately, the sensor head comprises a measurement light emitting optical system ( ), an image acquiring optical system ( ) and a two dimensional imaging device ( ). The controller can control the imaging condition associated with the brightness of the image in the form of a video signal both under a measurement mode and an observation mode. Under the measurement mode, with a light source ( ) for measurement turned on, the imaging condition is adjusted in such a manner that a measurement light radiated light image ( ) can be imaged at an appropriate brightness but a surrounding part ( ) of the measurement object is substantially darker than the appropriate brightness, and a desired displacement is computed according the video signal obtained by the two dimensional imaging device ( ). Under the observation mode, the imaging condition is adjusted in such a manner that the measurement position and the surrounding part of the measurement object can be imaged both at an appropriate brightness, and an image of the measurement position of the surface of the measurement object and the surrounding region ( ) is displayed on the screen of an image monitor ( ) according the video signal obtained by the two dimensional imaging device ( ).

Displacement sensor

Each of a detection sample object and a non-detection sample object is illuminated with S-polarization light, for instance. S-polarization light and P-polarization light reflected from each sample object are detected by different photodetecting elements. Glossiness values and light quantities of the detection and non-detection sample objects are judged based on detection outputs of the photodetecting elements, and a glossiness difference and a light quantity difference are calculated. An evaluation function having at least one of the glossiness and the light quantity as a variable is determined by using the glossiness difference and the light quantity difference. Thresholds for object discrimination are calculated based on evaluation function values of the detection and non-detection sample objects.

Reflection-type photoelectric sensing apparatus

Growing community of inventors

Takahatsuki, Japan

Nobuharu Ishikawa