Konica Corporation

Nobuaki Sugiyama

Yuichi Atarashi

Kazuhiro Nakanishi

Seiji Hidaka

Takashi Ishihara

Takehiko Hamaguchi

Kozue Yogata

Kosuke Toura

A photographic device set including: a photographic device having a shutter device, a camera lens, a diaphragm and a photographing operation section; a photographic film built in the photographic device in advance; and a packing material with which the photographic device is packed. In the photographic device set, the packing material has a transparent film and is provided with opaque portions at an area corresponding to the photographing operation section or to the camera lens of the photographic device.

Photographic device set

A lens-fitted film unit includes: a first member for constituting an external surface of the lens-fitted film unit; a second member for constituting the external surface together with the first member; and an external member adhered to at least a part of the first or second member so that at least one portion of a boundary portion of the first and second members is covered. A direction in which the external member is easily torn, is a direction intersecting with the boundary portion of the first and second members.

Lens-fitted film unit with easily torn external member

A method of producing an analytical curve for an analyzing apparatus which provides an analysis result on the basis of the analytical curve in response to a measurement value obtained by photoelectrically measuring light intensity reflected from a slide to be analyzed. A plurality of reference slides are measured by first analyzing apparatus which has a predetermined analytical curve, thereby obtaining a plurality of first measurement values and providing a plurality of first analysis results. The plurality of reference slides are further measured by second analyzing apparatus, thereby obtaining a plurality of second measurement values. Analytical curve for the second analyzing apparatus for produced on the basis of a relation between the first measurement values and the second measurement values so that a plurality of second analysis results correspond to the plurality of first analysis results.

Method of producing analytical curve

Growing community of inventors

Hino, Japan

Nobuaki Sugiyama