Santec Corporation

Santec Holdings Corporation

Noboru Uehara

Yuichi Takushima

Yuji Hotta

Yasuyuki Ozeki

Kentaro Yasunaka

A substrate rotating apparatus includes a main rotation mechanism, an auxiliary rotation mechanism, and a guide structure. The main rotation mechanism rotates around a first rotation shaft. The main rotation mechanism includes the auxiliary rotation mechanism. The auxiliary rotation mechanism revolves about the first rotation shaft, and rotates around a second rotation shaft. The second rotation shaft is displaced in a circumferential direction with respect to a third rotation shaft provided between the first rotation shaft and the second rotation shaft. The guide structure has a contact surface extending in a circumferential direction with respect to the first rotation shaft. The guide structure controls displacement of the second rotation shaft in the circumferential direction with respect to the third rotation shaft, and causes the auxiliary rotation mechanism to perform the revolving motion in an orbit along the contact surface.

Substrate rotating apparatus, processing system, and processing method

A substrate rotating apparatus comprises a main rotation mechanism, an auxiliary rotation mechanism, and a guide structure. The main rotation mechanism rotates around a first rotation shaft. The main rotation mechanism comprises the auxiliary rotation mechanism. The auxiliary rotation mechanism revolves about the first rotation shaft in accordance of rotation of the main rotation mechanism, and rotates around a second rotation shaft. The second rotation shaft is displaced in a radial direction with respect to the first rotation shaft. The guide structure has a contact surface extending in a circumferential direction with respect to the first rotation shaft. The guide structure controls displacement of the second rotation shaft in the radial direction, and causes the auxiliary rotation mechanism to perform the revolving motion in an orbit along the contact surface when the contact surface and the auxiliary rotation mechanism are in contact with each other.

Substrate rotating apparatus

An optical node device includes a light receiving/emitting portion having an input port into which a signal beam is incident and an output port that emits a signal beam of a selected wavelength, a chromatic dispersion device that scatters spatially the signal beam depending on the wavelength of the signal beam, an optical coupler that focuses, onto a two-dimensional plane, beams dispersed by the chromatic dispersion device, a spatial light modulating element arranged so as to receive incident light deployed on an xy plane made up of an x-axis direction deployed according to wavelength and a y-axis direction orthogonal to the x-axis direction, and having numerous pixels arranged in a lattice on the xy plane, and a spatial light modulating element driving portion that drives electrodes of the individual pixels arranged in the xy axial directions in the spatial light modulating element.

Optical node device

A multiple input/output wavelength selective switch deviceis configured of an N&#xd7;M optical cross connect switch, wavelength selectorand controller. The N&#xd7;M optical cross connect switchturns WDM signals of N channels inputted to input routes Rinto RinN into M WDM signals. The wavelength selectorcan perform a selection operation with respect to each of the M WDM signals according to their wavelengths and output the signals from output routes Routto RoutM.

Multiple input/output wavelength selective switch device

An optical pulse evaluation device and an in-service optical pulse evaluation device is disclosed which are capable of characteristics evaluation of an optical pulse itself or a sample launched therein in a relatively high bit-rate region. The optical pulse evaluation device evaluates a pulse waveform expressing an optical intensity of the optical pulse, an instantaneous frequency of the optical pulse, or a modulated light prepared by modulating the optical pulse in a light source end. The optical pulse evaluation device also observes a waveform change after a known optical pulse is passed through a device such as an optical fiber to evaluate a waveform deterioration or a compensation behavior caused by the device. The in-service optical pulse evaluation device is capable of measuring a wavelength dispersion in an optical communication.

Optical pulse evaluation device and in-service optical pulse evaluation device

PROBLEM TO BE SOLVED: to realize a wide bandwidth light source capable of a stable operation providing a less spectrum variation. SOLUTION: Optical pulsesoutputted by this optical pulse-generating deviceare split by optical coupler. The one of split optical pulses is inputted in white light-emitting deviceto emit the white light having the wide bandwidth. The other split is inputted in optical band pass filterin operation-stabilizing circuit. Optical detectordetects a signal level of a specific wavelength and input in feedback circuitto generate first and second feedback signalsand. Ring resonator fiber laseruses any one of them and controls a rotation angle of the waveplate to realize stabilization of the output.

Wide bandwidth light source

In an optical element, a first mirror stack layer is formed on a substrate, and a spacer layer made of a paraelectric material having a secondary electrooptic effect is formed thereon through a first conductive thin film. Further, a second mirror stack layer is formed thereon through a second conductive thin film, and a coupling layer is formed thereon; thus, a basic structure of the optical element is formed. By changing a voltage to be applied between the first and second conductive thin films, it becomes possible to switch wavelengths of light to be transmitted through the optical element at a high speed.

Optical element and optical add-drop module

An optical element has a structure in that a first mirror stack layer is formed on a substrate. A first transparent conductive film, a conductive buffer layer, a spacer layer having a primary or secondary electrooptic effect, a conductive buffer layer and a second transparent conductive film are stacked thereon in succession; and a second mirror stack layer is further formed thereon. A voltage is applied between the first and second transparent conductive films. The applied voltage change the refractive index of the spacer, changes a wavelength to be transmitted through or reflected from the layer.

Growing community of inventors

Aichi, Japan

Noboru Uehara