Hitachi, Ltd.

Riken Corporation

Hitachi-high-technologies Corporation

Hitachi Electronics Engineering Co., Ltd.

Noboru Moriya

Ken Harada

Tsuyoshi Matsuda

Tetsuya Akashi

Shokichi Matsunami

Yoshihiko Togawa

Tomoko Takeshita

Jun Otomo

Sakae Saito

Sayuri Nomura

Takeshi Kawasaki

Tomonori Nakano

Hirokazu Kato

Takeshi Fujita

Akira Sugawara

Masao Kamahori

Shin-ichiro Umemura

Masaharu Kiyama

Kotoko Hirose

Kotoko Urano

Yuusuke Miyazaki

Takamichi Muramatsu

In order to realize a multiple assembled easily with high accuracy, a multipole having assembly accuracy within 10 micrometer and within several seconds of angle is achieved by fixing multipole elements by being guided by grooves provided on an inner side of a cylindrical housing to form the multipole.

Multipole and charged particle radiation apparatus using the same

The present invention is based on the property that the electric and magnetic fields are independent of each other and normal to each other and the property that the deflection of a charged particle beam by the electromagnetic field follows the rule of linear combination. The present invention employs a system that creates a region in which there exist both electromagnetic field and controls the deflection of a charged particle beam in each of the electric and magnetic fields.

Electromagnetic field application system

A double-biprism electron interferometer is an optical system which dramatically increases the degree of freedom of a conventional one-stage electron interferometer. The double biprism interferometer, however, is the same as the optical system of the single electron biprism in terms of the one-dimensional shape of an electron hologram formed by filament electrodes, the direction of an interference area, and the azimuth of the interference fringes. In other words, the longitudinal direction of the interference area is determined corresponding to the direction of the filament electrodes, and the azimuth of the interference fringes only coincides with and is in parallel with the longitudinal direction of the interference area. An interferometer according to the present invention has upper-stage and lower-stage electron biprisms, and operates with an azimuth angle &#x3a6; between filament electrodes of the upper-stage and lower-stage electron biprisms to arbitrarily control an interference area and an azimuth &#x3b8; of the interference fringes formed therein.

Interferometer

The present invention provides an aberration corrector giving excellent assembly accuracy but having fewer parts and fewer adjustment locations in number. In order to achieve it, a multistage multipole is formed by arranging plural combinations of electrodes around an optical axis using alignment blocks, each combination of electrodes being made by brazing-integrating plural electrodes with a ceramic material interposed therebetween.

Aberration corrector and charged particle beam apparatus using the same

An interferometer is disclosed which has upper-stage, intermediate-stage, and lower-stage electron biprisms. The disclosed interferometer operates with an azimuth angle &#x3a6; among filament electrodes of the three electron biprisms to arbitrarily control an interference area and an azimuth &#x3b8; of the interference fringes formed therein, eliminates Fresnel fringes generation, and allows independent control of an interference fringe spacing s and the azimuth &#x3b8; of the interference fringes.

Interferometer having three electron biprisms

Charged particle beam equipment having a rotary mechanism in which shift of the observing/machining position incident to the rotary operation of the equipment having the rotary mechanism can be corrected conveniently with high precision in a plane perpendicular to the optical axis of the optical system of charged particle beam or in a slightly inclining plane. An X-Y shift incident to rotation in a plane is determined from the angular information of a rotary mechanism such as a sample holder, diaphragms or biprisms in the charged particle beam equipment, and then driving or controlling is performed to cancel the X-Y shift.

Charged particle beam equipment

The present invention provides a technique enabling to control fringe spacing s and an interference width W independently of each other, which are important parameters for an interferometer using an electron biprism. In the present invention, two electron biprismsare used in two stages along the optical axis, and fringe spacing s and an interference width W are controlled independently of each other by controlling a voltage applied to an electrode of each of the electron biprisms. Also Fresnel diffraction can be suppressed.

Apparatus for microinjection of sample into amphibian oocytes

An automatic electrophysiological measuring apparatus to automatically penetrate a glass electrode(s) into the membrane of a Xenopus Oocyte to hold the membrane potential and to automatically measure reactions to the administration of a medicine is to be provided. A glass electrode in the air is moved toward a Xenopus Oocyte held in a cell. Changes in the potential states of the glass electrodes are picked up by a control computer to distinguish the relative positions of the glass electrode and the Xenopus Oocyte , and the sequence of electrophysiological measurement so as to penetrate the glass electrode into the Xenopus Oocyte , hold the membrane potential and automatically administer the medicine.

Automatic electrophysiological measuring apparatus/method

Automatic electrophysiological measuring apparatus / method

Arranging a pair of temperature control units on both sides of gel 1 and arranging light-transmitting slit 134 on one of the elements, irradiation of an excitation beam over the gel 1 and signal detection are practiced through the slit 134. Introducing dry air onto the slit part, mildew occurrence is prevented on the detecting part. Detecting the power level applied to the gel and calculating the temperature of the temperature control units so that the gel temperature might be a predetermined temperature, on the basis of the detected power level, thereafter carrying out the feedback control of the power level, the gel temperature can be controlled appropriately and strictly during electrophoresis in an automatic fluorescent electrophoresis system, so that high-speed analysis can be done highly reproducibly at a higher voltage applied even by SSCP.

DNA analyzer

Growing community of inventors

Tokorozawa, Japan

Noboru Moriya