Tektronix, Inc.

Noah Brummer

Jan P Peeters Weem

Andy K Lim

An equivalent-time sampling test and measurement instrument for acquiring a repeating pattern signal under test at or near a maximum sampling speed of the test and measurement instrument. The test and measurement instrument includes a first input configured to receive repeating pattern information about a signal under test, a second input configured to receive the signal under test, one or more processors configured to determine an optimized trigger holdoff period that is set based on a minimum trigger holdoff period of a test and measurement instrument, and an acquisition unit configured to acquire a portion of the signal under test every optimized trigger holdoff period.

Pattern acquisitions in equivalent time sampling systems

A sampling gate comprising a first frequency input coupled to a first frequency path from a broadband photodiode. The sampling gate also includes a positive bias input coupled to a positive offset portion of a second frequency path from the broadband photodiode. The sampling gate also includes a negative bias input coupled to a negative offset portion of the second frequency path from the broadband photodiode. The sampling gate combines a first frequency signal from the first frequency path and a second frequency signal from the second frequency path to create a combined broadband frequency signal from the broadband photodiode.

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Portland, OR, United States of America

Noah Brummer