Primesense Ltd

Apple Inc.

Niv Galezer

Alexander Shpunt

Dmitri Rais

Zafrir Mor

Ronen Akerman

Yoed Arieli

Tomer Segev

Dudu Voschina

Erez Sali

Daniel Cohen

A method including providing a device that projects a pattern of coherent radiation. The method further includes capturing a reference image of the pattern using an image sensor by projecting the pattern of the coherent radiation onto a reference surface and engendering a relative motion between the reference surface and the image sensor while capturing the reference image. The method also includes storing the reference image in a memory associated with the device.

Reference image techniques for three-dimensional sensing

A method for forming a three-dimensional (3D) map of an object, including illuminating the object from a light source so as to project a pattern onto the object, capturing an image of the pattern using an array of detector elements, and processing the captured image so as to measure respective offsets of elements of the pattern in the captured image relative to a reference pattern, the offsets including at least a first offset of a first element of the pattern and a second offset of a second element of the pattern, measured respectively in first and second, mutually-perpendicular directions in a plane of the array. The method further includes computing a correction factor in response to the first offset, applying the correction factor to the second offset so as to find a corrected offset, and computing depth coordinates of the object in response to the corrected offset.

Error compensation in three-dimensional mapping

Optical apparatus includes a device package, with a radiation source contained in the package and configured to emit a beam of coherent radiation. A diffractive optical element (DOE) is mounted in the package so as to receive and diffract the radiation from the radiation source into a predefined pattern comprising multiple diffraction orders. An optical detector is positioned in the package so as to receive and sense an intensity of a selected diffraction order of the DOE.

Optical projector with beam monitor including sensing intensity of beam pattern not projected toward an object

Optical projector with beam monitor including mapping apparatus capturing image of pattern projected onto an object

Growing community of inventors

Tel Aviv, Israel

Niv Galezer