General Electric Company

Ge Betz, Inc.

Nityanand Gopalika

Thomas James Batzinger

Manoharan Venugopal

Debasish Mishra

Rajashekar Venkatachalam

Forrest Frank Hopkins

William Robert Ross

Vamshi Krishna Reddy Kommareddy

Brian W Lasiuk

Michael Robert Hopple

Sivaramanivas Ramaswamy

Elizabeth Lockenberg Dixon

Prasad Thapa

Vamishi Krishna Reddy Kommareddy

An imaging technique is provided for acquiring scatter free images of an object. The technique includes acquiring a plurality of projection images of the object using a source and a detector oriented at a plurality of projection angles relative to the object, and generating a plurality of scatter free projection images by correcting the plurality of projection images based on respective ones of a plurality of stored scatter images. The scatter images are generated and stored for each of the projection angles by positioning a scatter rejection plate between the object and the detector. The technique further includes reconstructing a three-dimensional image of the object based on the scatter free projection images.

Imaging system and method with scatter correction

A digital radiography imaging system for acquiring digital images of an object, and a method for transforming digital images into an absolute thickness map characterizing the object under inspection. The system includes a radiation source for directing radiation through a desired region of the object, and a radiation detector having a plurality of sensing elements for detecting radiation passing through the object. Numerical data generated from each sensing element is calibrated, for example by correcting for variations in radiation paths between the source and detector, by correcting for variations in the spatial frequency response (MTF) of the detector, by correcting for variations in the geometric profile of the object under inspection, and by correcting for material contained in and/or around the object. The calibrated data is processed in order to generate and display an absolute thickness map of the object. The calibration procedures are adapted for extracting a thickness map from both isotope sources and X-ray tube sources.

Converting a digital radiograph to an absolute thickness map

Growing community of inventors

State College, PA, United States of America

Nityanand Gopalika