Freescale Semiconductor,inc.

Nxp Usa, Inc.

Nitin Singh

Amit Jindal

Anurag Jindal

Kumar Abhishek

Stephan Matthias Herrmann

Joachim Fader

Rohit Tomar

Gaurav Jain

Lalit Mohan Singh Miyan

Methods and systems are disclosed for asymmetric memory access to memory banks within integrated circuit (IC) systems. Disclosed embodiments include a memory and a memory controller within an integrated circuit. The memory includes a number of different memory banks, and the memory controller includes a number of different access ports coupled to the memory banks. The memory controller is also configured to provide asymmetric memory access for access requests to memory banks based upon access ports used for memory access requests. Additional disclosed embodiments further use asymmetric access times or asymmetric access bandwidths to provide this asymmetric access to memory banks within system memories for integrated circuit (IC) systems. By providing asymmetric access times or bandwidths for multiple access ports within a memory controller to multiple different memory banks within a system memory, overall access latency or system cost is reduced for the IC systems.

Systems and methods for asymmetric memory access to memory banks within integrated circuit systems

Hardware processors in an SOC integrated circuit logically swapping memories by remapping memory addresses, including tightly coupled and local memories, to enable a sequence of data-processing algorithms to execute more quickly by different hardware processors without having to copy the data between different memories using a relatively slow data crossbar switch. When a memory stores error-correction code (ECC) address information linking stored ECC data with stored user data, the hardware processor dynamically remaps the ECC address information, as needed.

Memory access scheme for system on chip

A controller executes a first LBIST test on a device at a first shift frequency on a plurality of partitions and detects any voltage drop at sense points in each partition during the test. If a voltage drop is detected, then the test is re-run for those partitions that failed the first test. If failures are detected during the re-execution, then a further test at a lower shift frequency is performed. The partitions can be tested sequentially or in parallel and invention has the advantage of reducing the time taken for executing LBIST when the device is booted.

Method and system for logic built-in self-test

An integrated circuit includes a set of electronic circuits, a voltage regulator, and a power management module. The power management module includes a set of dummy circuits connected to the set of electronic circuits, a control signal generator, a counter and a shift register. The control signal generator generates a control signal based on the current consumption of the set of electronic circuits dropping below a threshold value over a predefined period of time. The counter generates a count signal for a predetermined time period when the control signal is activated. The shift register receives the count signal, enables the dummy circuits when the count signal is received, and disables the dummy circuits in a daisy chain fashion during the predetermined time period.

Integrated circuit power management module

A system for testing an error detection circuit includes a fault injection unit for operating the error detection circuit in a fault injection mode. A fault is inserted in either of a primary or a redundant processor. Output signals generated by the primary and redundant processors are compared and checked for a mismatch and the error detection circuit outputs a test signal based on the comparison result.

System for testing error detection circuits

An integrated circuit (IC) includes a flip-flop that stores data when the IC is in built-in self-test (BIST) mode. The flip-flop includes a master latch connected to a slave latch, which in turn is connected to a data retention latch. A control circuit is connected to the flip-flop. During normal operation, the master latch receives a data input signal, which is transmitted through the slave latch to another flip-flop of the IC. When the control circuit initiates BIST (scan testing), data stored in the slave latch is transferred to the data retention latch. Upon completion of BIST, the data stored in the retention latch is used to restore the flip-flop to its original state.

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New Delhi, India

Nitin Singh