Orbotech Limited

Nissim Savareigo

Igor A Markov

Dan Zemer

Nur Arad

Dan Shalom

A method for automatically optically inspecting an electrical circuit (), comprising: acquiring at least one optical image of an electrical circuit (); generating at least one first inspection image from the at least one image and determining regions of candidate defects () therefrom; generating at least one additional inspection image for regions surrounding candidate defects (), said at least one additional inspection image at least partially including optical information not included in the at least one first inspection image; and determining whether the candidate defect () is a specious defect by inspecting the at least one additional inspection image.

Reduction of false alarms in PCB inspection

A first inspection functionality is provided to obtain information about a first attribute at a conductor location on an electrical circuit. A second inspection functionality is provided to obtain information about a second attribute at the conductor location. A combination of first attribute information and second attribute information is analyzed to determine an inspection attribute of the conductor at the conductor location. Attribute information may relate to one or more of: reflectance, fluorescence or height.

Electrical circuit conductor inspection

Apparatus and method for post etching inspection of electrical circuits including an optical inspection assembly viewing an electrical circuit at various regions thereon and providing output indications of etching characteristics of the electrical circuit at the various regions and output circuitry receiving the output indications of etching characteristics of the electrical circuit at the various regions and providing an output indication of variations in the etching characteristics between at least some of the various regions.

Post etch inspection system

An automated optical inspection system including a source of electromagnetic radiation for delivering a radiation beam on an article to be inspected, a plurality of sensors arranged with respect to the radiation beam for sensing a plurality of radiation properties associated with the radiation beam impinging at least at a zone of impingement on a substance found on the article to be inspected, the plurality of sensors including a luminescence sensor for sensing luminescence of the substance due to the beam impinging thereon and a reflectance sensor for sensing reflectance of the beam from the substance the sensors transmitting information signals based on the radiation properties sensed by the sensors and a processor in communication with the sensors operative to receive the information signals for a plurality of zones of impingement, to combine the signals from the sensors and to analyze them, and to generate an output indicating the presence of defects based on the analysis.

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Ashdod, Israel

Nissim Savareigo