International Business Machines Corporation

Nisha Yohannan

Paul William Coteus

Gareth Geoffrey Hougham

Steven Alan Cordes

Alphonso Philip Lanzetta

Daniel Peter Morris

Matthew J Farinelli

Sherif Ahmed Goma

Joanna Rosner

Ali Afzali

Techniques for forming enhanced electrical connections are provided. In one aspect, a method of forming an electrical connecting device includes the steps of: depositing an elastomeric material on an electrically insulating carrier; and metallizing the elastomeric material so as to form an electrically conductive layer running continuously through a plane of the carrier and along a surface of the elastomeric material.

Method of forming metallized elastomeric electrical contacts

A probe structure for an electronic device is provided. In one aspect, the probe structure includes an electrically insulating carrier having one or more contact structures traversing a plane thereof. Each contact structure includes an elastomeric material having an electrically conductive layer running along at least one surface thereof continuously through the plane of the carrier. The probe structure includes one or more other contact structures adapted for connection to a test apparatus.

Metalized elastomeric probe structure

Techniques for forming enhanced electrical connections are provided. In one aspect, an electrical connecting device comprises an electrically insulating carrier having one or more contact structures traversing a plane thereof. Each contact structure comprises an elastomeric material having an electrically conductive layer running along at least one surface thereof continuously through the plane of the carrier.

Metalized elastomeric electrical contacts

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Yonkers, NY, United States of America

Nisha Yohannan