Apple Inc.

Nirali Shah

Robert W Schlub

Mattia Pascolini

Ruben Caballero

Matthew A Mow

Hao Xu

Qingxiang Li

Jayesh Nath

Hongfei Hu

Nanbo Jin

Ming-Ju Tsai

Yuehui Ouyang

Liang Han

Yijun Zhou

Joshua G Nickel

Salih Yarga

Thomas E Biedka

Dean F Darnell

Xu Han

Anand Lakshmanan

An electronic device may have a conductive housing with an antenna window. A display cover layer may be mounted on the front face of the device. Antenna and proximity sensor structures may include a dielectric support structure with a notch. The antenna window may have a protruding portion that extends into the notch between the display cover layer and the antenna and proximity sensor structures. The antenna and proximity sensor structures may have an antenna feed that is coupled to a first conductive layer by a high pass circuit and capacitive proximity sensor circuitry that is coupled to the first conductive layer and a parallel second conductive layer by a low pass circuit. The first conductive layer may be formed from a metal coating on the support structure. The second conductive layer may be formed from patterned metal traces in a flexible printed circuit.

Antenna and proximity sensor structures having printed circuit and dielectric carrier layers

Radio frequency test systems for characterizing antenna performance in various radio coexistence scenarios are provided. In one suitable arrangement, a test system may be used to perform passive radio coexistence characterization. During passive radio coexistence characterization, at least one signal generator may be used to feed aggressor signals directly to antennas within an electronic device under test (DUT). The aggressor signals may generate undesired interference signals in a victim frequency band, which can then be received and analyzed using a spectrum analyzer. During active radio coexistence characterization, at least one radio communications emulator may be used to communicate with a DUT via a first test antenna. While the DUT is communicating with the at least one radio communications emulator, test signals may also be conveyed between DUTand a second test antenna. Test signals conveyed through the second test antenna may be used in obtaining signal interference level measurements.

Methods and apparatus for performing coexistence testing for multi-antenna electronic devices

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Mountain View, CA, United States of America

Nirali Shah