Sandisk Technologies Inc.

Western Digital Technologies, Inc.

Nir Amir

Yehuda Hahn

Gadi Vishne

Avichay Haim Hodes

Joshua Lehmann

A method of forming a semiconductor device includes through-package debug features enabling debug of a BGA package while mounted to a printed circuit board or other host device. In one example, the through-package debug features are filled or plated vias extending from a surface of the semiconductor device, through a device housing, down to test pads on the substrate. In another example, the through-package debug features are open channels formed from a surface of the semiconductor device.

Semiconductor device including through-package debug features

A semiconductor device includes through-package debug features enabling debug of a BGA package while mounted to a printed circuit board or other host device. In one example, the through-package debug features are filled or plated vias extending from a surface of the semiconductor device, through a device housing, down to test pads on the substrate. In another example, the through-package debug features are open channels formed from a surface of the semiconductor device.

Methods, systems, and computer readable media for storage device workload detection using power consumption are disclosed. One aspect of the subject matter described herein includes a storage device. The storage device includes non-volatile storage. The storage device further includes a device controller for controlling access to the non-volatile storage. A power management controller separate from the device controller senses an indication of power used by at least one of the non-volatile storage and the device controller, compares the sensed indication of power to at least one threshold, and, in response to a predetermined relationship between the sensed indication of power and the at least one threshold, signals the device controller of a workload state of the storage device.

Methods, systems, and computer readable media for storage device workload detection using power consumption

A storage system and method for adaptive thermal throttling are disclosed. In one embodiment, a method for adaptive thermal throttling is provided that is performed in a storage system having a memory. This method comprises determining if a temperature of the storage system is above a threshold temperature; and in response to determining that the temperature of the storage system is above the threshold temperature: reducing performance of the storage system in an iterative manner until the temperature of the storage system is within a temperature envelope around the threshold temperature; and storing, in the memory, a value indicating what the performance of the storage system was reduced to in order to get the temperature within the temperature envelope. Other embodiments are possible, and each of the embodiments can be used alone or together in combination.

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Beit Hashmonai, Israel

Nir Amir