Grace Semiconductor Manufacturing Corporation

Shanghai Academy of Agricultural Sciences

Ning Jiang

Yu Meng Li

Feng Zhou

Dan Zhang

Hui Calvin Yang

Jun He

Hailong Yu

Zhen Xu

Jianyu Liu

Xiaodong Shang

Lujun Zhang

Qi Tan

Xinghua Pu

Mon-Chin Tsai

Qiaozhen Li

Ruijuan Wang

Chunyan Song

Meiyan Zhang

A method for genetic transformation of edible mushrooms is provided relating to the technical field of genetic transformation of, enoki mushroom and shiitake. The disclosed method for genetic transformation ofincludes: inoculatingliquid mycelia into a foxtail-millet-grain culture medium, and pre-culturing them at 20-25&#xb0; C. untilmycelia grow on surfaces of foxtail millet grains. This method uses the foxtail millet grains as an attachment matrix, and during the pre-culturing and co-culturing, the culture substrate is shaken up every day. The method for genetic transformation of enoki mushroom or shiitake includes: inoculation of enoki mushroom mycelia or shiitake mycelia, activated culturing of, andinfecting a foxtail millet grain-enoki mushroom mycelium matrix or a foxtail millet grain-shiitake mycelium matrix.

Method for genetic transformation of edible mushrooms

A test structure for testing a multidirectional current leakage path. A first doped region of a first conductivity is in the first well of the first conductivity in a substrate, in which the first doped region has a dopant concentration higher than the first well has. A first contact is on the first doped region and contacts the first doped region. The first contact has first and second portions respectively parallel to the first and second directions. A plurality of second doped regions of a second conductivity are in the first well and isolated from the first doped region. In a third direction, the second regions are adjacent to each another and isolate the first portion from the second portion. A plurality of second contacts are on the second doped regions and each one is corresponding to each the second doped region. With a relative shift between the first contact and the second doped region, the partial overlap is used in the test of a multidirectional leakage path.

Multidirectional leakage path test structure

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Shanghai, China

Ning Jiang