Rockwell Automation Technologies Incorporated

Innovaciones Microelectronicas, S.l.

Teledyne Innovaciones Microelectronicas Slu

Nilesh Pradhan

Derek William Jones

Richard Galera

Anne E Bowlby

Francis Lawrence Leard

Rafael Dominguez Castro

Sergio Morillas Castillo

Rafael Romay Juárez

Amanda Jimenez Marrufo

Fernando Manuel Medeiro Hidalgo

Rafael Romay JUÁREZ

A time-of-flight (TOF) sensor device is configured to perform classification analytics on a waveform signal representing a reflected light pulse, and to classify an object from which the light pulse was received based on characteristic properties of the reflected pulse. The TOF sensor device can compare the reflected pulse waveform with stored characteristic waveform profiles indicative of different types of objects or atmospheric particulates, including but not limited to snow, aerosol, water, fog, or mist. Some embodiments of TOF sensor device can also detect excessive levels of mist or suspended particulates that may reduce the detection accuracy of the sensor. To this end, such embodiments project focused light beams according to a defined pattern, and compare the reflected pattern with the defined pattern to determine a degree of pattern distortion attributable to the presence of mist.

Waveform reconstruction in a time-of-flight sensor

An optical safety scanner system comprises a first illumination source for detecting presence and distances of people or other objects within a hazardous industrial area based on triangulation, and a second illumination source that verifies accurate and reliable detection by the first illumination source. The first illumination source can project LED or laser light for triangulation of objects, and the second illumination source can project a wide beam of light for detection of other intrusive objects that may be blocking the scanner system's camera and preventing accurate triangulation of people or vehicles. If the image frame generated based on the second light identifies presence of an object that is not detected by the triangulation analysis of the laser light, the safety scanner system assumes that an object is obstructing the safety scanner system's camera, and performs a suitable safety action.

Triangulation applied as a safety scanner

A time-of-flight (TOF) sensor device is provided that is capable of accurately recovering waveforms of reflected light pulses incident on the sensor's photo-receiver array using a low sampling rate. A number of samples for a received light pulse incident on a given photo-receiver are obtained by emitting a light pulse to the viewing field, integrating the electrical output generated by the photo receiver over an integration period, and adding the integral values for respective integration cycles to yield an accumulation value. This process is repeated for multiple accumulation cycles; however, for each consecutive accumulation cycle the start of the integration period is delayed relative the start time of the integration period for the previous cycle by a delay period. Sampled values for the waveform are obtained by determining the difference values between consecutive accumulation values for the respective accumulation cycles.

An imaging sensor device is configured to illuminate a viewing field using an array of focused light spots spaced across the viewing field rather than uniformly illuminating the viewing field, thereby reducing the amount of illumination energy required to produce a given intensity of light reflected from the spots. In some embodiments, the imaging sensor device can project an array of focused light spots at two different intensities or brightness levels, such that high intensity and low intensity light spots are interlaced across the viewing field. This ensures that both relatively dark and relatively bright or reflective objects can be reliably detected within the viewing field. The intensities of the light spots can be modulated based on measured conditions of the viewing field, including but not limited to the measured ambient light or a determined dynamic range of reflectivity of objects within the viewing field.

Optical area monitoring with spot matrix illumination

An industrial safety system is provided that integrates optical safety monitoring with machine control. The safety system includes an imaging sensor device supporting pixel array processing functions that allow time-of-flight (TOF) analysis to be performed on selected portions of the pixel array, while two-dimensional imaging analysis is performed on the remaining portions of the array, reducing processing load and response time relative to performing TOF analysis for all pixels of the array. The portion of the pixel array designated for TOF analysis can be pre-defined through configuration of the imaging sensor device, or can be dynamically selected based on object detection and classification by the two-dimensional imaging analysis. The imaging sensor device can also implement a number of safety and redundancy functions to achieve a high degree of safety integrity.

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South Grafton, MA, United States of America

Nilesh Pradhan