Battelle Memorial Institute

Nigel D Browning

Andrew J Stevens

Libor Kovarik

Andrey V Liyu

Nathan L Canfield

David W Gotthold

Alan G Joly

Eric Jensen

Jay W Grate

Xin Yuan

Lawrence L Carin

Bryan A Stanfill

Sarah M Reehl

Margaret C Johnson

Lisa M Bramer

Patricia Abellan

A method includes directing a probe beam to a target that includes an array of data portions in a data storage medium arranged so that a beam area of the probe beam extends across a plurality of adjacent data portions, the array including a data portion subset with each data portion of the subset responsive to the probe beam to produce a response illumination, receiving the response illumination at a detector, and determining data values corresponding to the plurality of adjacent data portions based on the received response illumination. Apparatus and systems are also disclosed.

Systems and methods for data storage and retrieval

Mask-modulated spectra are incident to a sensor and are summed during a frame time. After the frame time, a compressed spectrum is read out based on the sum and decompressed to obtain spectra for some or all specimen locations. The mask-modulated spectrum that are summed are associated with different modulations produced by a common mask.

Compressive scanning spectroscopy

Disclosed are methods for sensing conditions of an electron microscope system and/or a specimen analyzed thereby. Also disclosed are sensor systems and electron microscope systems able to sense system conditions, and/or conditions of the specimen being analyzed by such systems. In one embodiment, a sparse dataset can be acquired from a random sub-sampling of the specimen by an electron beam probe of the electron microscope system. Instrument parameters, specimen characteristics, or both can be estimated from the sparse dataset.

Sensing analytical instrument parameters, specimen characteristics, or both from sparse datasets

Compositions are provided that can include nanoscale particles including metal cations such as cerium having an average particle size of less than 10 nm. The nanoscale particles can include cerium and oxygen. Methods for forming nanoparticles are provided. The methods can include exposing a metal cation within a solution to radiation to form metal nanoparticles that can include metal cations. The methods can include exposing a cerium salt solution to radiation to form the nanoparticles. The methods can include exposing solvated metal cations to radiation to precipitate nanoparticles that include metal cations such as Ce. The methods can include exposing the homogeneous solution to radiation to precipitate nanoparticles. The methods can include: providing an aqueous solution comprising metal cations; and increasing the pH of the aqueous solution with radiation to form nanoparticles that include metal cations. Nanoparticle generators are provided. The generators can include: a reactant reservoir comprising a metal cation in solution; a fluid cell in fluid communication with the reactant reservoir; a radiation source operatively aligned with the fluid cell; and a product reservoir in fluid communication with the fluid cell.

Nanoparticles, methods for producing nanoparticles and nanoparticle generators

Sparse sampling approaches and probe systems for analytical instruments are disclosed providing for effective sub-sampling of a specimen and inpainting to reconstruct representations of actual information. The sub-sampling involves serial acquisition of contiguous measured values lying at positions along a scan path extending in a line toward a first direction and having random perturbations in a second direction. The perturbations are limited within a predetermined distance from the line. Inpainting techniques are utilized among the measured values to reconstruct a representation of actual information regarding the specimen.

Sparse sampling methods and probe systems for analytical instruments

Disclosed are methods for optimized sub-sampling in an electron microscope. With regard at least to utilization of electron dose budgets, of time for acquisition of measurements, and of computing/processing capabilities, very high efficiencies can be achieved by informing and/or adapting subsequent sub-sampling measurements according to one or more earlier-acquired sparse datasets and/or according to analyzes thereof.

Optimized sub-sampling in an electron microscope

Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.

Growing community of inventors

Richland, WA, United States of America

Nigel D Browning