Allegro Microsystems, LLC

Nicolas Rigoni

Octavio H Alpago

Nicolás Rafael Biberidis

Juan Manuel Cesaretti

Leandro Tozzi

Hernán D Romero

Gerardo A Monreal

Sundar Chetlur

Harianto Wong

Jesse Lapomardo

Lucas Intile

James McClay

Vyankatesh Gupta

Lautaro Casella

Fernando Orge

Muhammed Sarwar

Ahmed Hassan Fahmy

Ignacio Lesser

Brian Bernier

An angle sensor comprising: a plurality of magnetic field sensing elements configured to detect a magnetic field and generate a respective plurality of analog magnetic field signals; a plurality of analog frontend circuits each analog frontend circuit associated with a respective magnetic field sensing element; and a digital feedback circuit configured to generate digital magnetic field signals from the plurality of analog magnetic field signals and generate digital error correction values, wherein the plurality of analog frontend circuits are configured to obtain the digital error correction values from the digital feedback circuit, generate analog correction values from the digital error correction values, and apply the analog correction values to the plurality of analog magnetic field signals to generate a plurality of corrected analog magnetic field signals.

Analog angle sensor with digital feedback loop

An angle sensor can have a plurality of magnetic field sensing elements configured to detect a magnetic field and generate a respective plurality of magnetic field signals. In response to these magnetic field signals, a processor generates an uncorrected angle signal that is indicative of an angle of the magnetic field. An error corrector generates an error value using one or more of the previous samples of the uncorrected angle signal, and a summation element applies the error value to a current sample of the uncorrected angle signal to generate a corrected angle signal. The error corrector can generate the error value by applying a correction factor to a previous sample of the uncorrected angle signal, or by applying a correction factor to a predicted current sample of the uncorrected angle signal.

Angle sensor with offline error correction

A method comprising: performing a first read from an address in a data storage module by using a first read voltage; storing, in a first register, data that is retrieved from the data storage module as a result of the first read; performing a second read from the address by using a second read voltage; storing, in a second register, data that is retrieved from the data storage module as a result of the second read; detecting whether a weak bit condition is present at the address based on the data that is stored in the first register and the data that is stored in the second register; and correcting the weak bit condition, when the weak bit condition is present at the address.

Method and apparatus for eliminating bit disturbance errors in non-volatile memory devices

A method is disclosed for use in an electronic device having a non-volatile storage device and a volatile storage device, the method comprising: retrieving a first encoded data packet from a first address in the non-volatile storage device; decoding the first encoded data packet to obtain a first data item and a first error code corresponding to the first data item, the first encoded data packet being decoded by using a first coding key that is associated with the first address; detecting whether the first data item is corrupt based on the first error code and an error correction function, storing the first data item at a first address in the volatile storage device when the first data item is not corrupt, and transitioning the electronic device into a safe state when the first data item is corrupt.

Non-volatile memory data and address encoding for safety coverage

In one aspect, an integrated circuit (IC) includes a multiplexor configured to receive data from a non-volatile memory and configured to receive data from a shadow memory, a shift register configured to generate a first signature from the data received from the non-volatile memory and configured to generate a second signature from the data received from the shadow memory; a signature storage configured to store the first signature; and a shadow memory checking controller configured to enable the multiplexor to send the data from the non-volatile memory to the shift register, and send a command to reload the shadow memory with data from the non-volatile memory in response to receiving an error flag. The IC also includes a comparator circuit configured to compare the first signature and the second signature and configured to send the error flag in response to the first signature and the second signature being different.

Shadow memory checking

An integrated circuit sensor can have a test program generator that is configured to receive a portion of a scan vector, where the scan vector includes a test mode signal and a scan enable signal. The test program generator is configured to retrieve a launch-off-capture test sequence from the scan vector and use the launch-off-capture test sequence and the test mode signal to generate a launch-off-capture test signal. A test signal generator is configured to generate a launch-off-shift test signal using the launch-off-capture test signal and the scan enable signal. A built-in self-test circuit is configured to test the integrated circuit sensor using the launch-off-shift test signal.

Fault test circuit using launch-off-shift scan

A magnetic field sensor includes a first magnetic field sensing element first generating a first signal having a first axis of maximum sensitivity, a second magnetic field sensing element for generating a second signal and having a second axis of maximum sensitivity, one or more detectors for receiving an output of the first magnetic field sensing element or the second magnetic field sensing element, and a processor that receives an output of the one or more detectors and uses the output of the one or more detectors to calculate a first constant Kand a second constant Kand then uses Kand Kto compensate for an orthogonality error between the first axis of maximum sensitivity and second axis of maximum sensitivity. The detectors include peak detectors and/or zero-crossing detectors that compare the output of the first input signal or the second input signal with a threshold or zero.

Non-orthogonality compensation of a magnetic field sensor

A magnetic field sensor that detects an angle of a target includes a first channel having first and second magnetic field sensing elements that are orthogonal with respect to each other and produce first and second magnetic field signals, and a second channel having third and fourth magnetic field sensing elements that are orthogonal with respect to each other and produce third and fourth magnetic field signals. The third sensing element is positioned at an angle (e.g., 45-degrees) with respect to the first sensing element. The magnetic field sensor includes a low power mode circuit that uses comparators to compare the first, second, third, and fourth magnetic field signals to a first, second, third, and fourth threshold, respectively. A processor is configured to use an output of the low power mode circuit to determine the angle of the target.

Magnetic field angle sensor having a low power mode and associated methods

A method for multi-level memory safety for a sensor integrated circuit can include loading a blocking bit into a volatile memory from a non-volatile memory and providing the blocking bit to a gating circuit from the volatile memory. Further, the method may include the gating circuit determining whether to provide a default value to a functional logic based upon the provided blocking bit.

Multi-level memory safety of a sensor integrated circuit

An integrated circuit with transmission line error detection comprises a substrate, a package enclosing the substrate, a lead extending from the inside of the package to the outside of the package, and a circuit supported by the substrate. The circuit includes an input circuit and an output circuit. A first wire is coupled between the output circuit and the lead and a second wire is coupled between the lead and the input circuit so that the input circuit receives a signal generated by the output circuit after the signal has been transmitted across the first and second wires.

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Buenos Aires, Argentina

Nicolas Rigoni