Essilor International (Compagnie Generale D'optique)

Nicolas La Villonniere

Fabien Muradore

Stéphane Gueu

Asma Lakhoua

The subject of the present invention is a method and a system for measuring the geometric or optical structure of an optical component. In particular, the invention relates to a method for measuring the geometric structure of a component bounded by a first side () and a second side (), said method comprising steps of: (S) measuring a first signal (MS) resulting from a first conversion of a first probe signal (PS), by at least said first side (); (S) measuring a second signal (MS) resulting from a second conversion of a second probe signal (PS), by at least said second side (); (S) determining a third conversion making it possible to convert a first set of coordinates (R) associated with the measurement of the first signal (MS) to a second set of coordinates (R) associated with the measurement of the second signal (MS); (S) estimating said first side () using the first signal (MS), said first simulation and a first cost criterion (V) quantifying a difference between the estimation (FS) and the first signal (MS); and (S) estimating said second side () using the second signal (MS), said second simulation, said third conversion and a second cost criterion (V) quantifying a difference between the estimation (ES) and the second signal (MS).

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Charenton le Pont, France

Nicolas La Villonniere