Melexis Technologies Sa

Melexis Technologies Nv

Nicolas Dupre

Gael Close

Yves Bidaux

Lionel Tombez

Eric Lahaye

Jean-Claude Depoorter

Tim Vangerven

David Goyvaerts

Theo Le Signor

Jerome Degois

Théo Le Signor

A force sensor has a sensing system including a target piece and a sensing element, configured to provide changes of a magnetic field, being generated by motion of the target piece. The sensing element senses these changes and provides a signal representative of the position of the target piece. An integrated circuit with processing means can process signals from the sensing element. A semiconductor package includes at least the integrated circuit. A flexible piece includes the target, and it is attached to the semiconductor package. The attachment area between the flexible piece and the semiconductor package does not extend beyond the top projection, or outline, of the semiconductor package. The flexible piece receives a force stimulus, so that upon exerting a force on the flexible piece, the displacement of the target piece with respect to the surface of the semiconductor package can be sensed by the sensing element.

Force sensor with target on semiconductor package

A weight sensor comprises a sensing system including a target piece and a sensing element, configured to provide changes of a magnetic field, being generated by motion of the target piece. The sensing element senses these changes and provides a signal representative of the position of the target piece. An integrated circuit with processing means can process signals from the sensing element. The flexible piece receives a force stimulus, so that upon exerting a force on the flexible piece by a product due to the weight of said product, the displacement of the target piece with respect to sensing elements can be sensed.

Force sensing scale with target

A method of determining an orientation α,β of a magnet which is pivotable about a reference position having a predefined position relative to a semiconductor substrate, comprising: a) determining at least two of the following magnetic field gradients: i) a first magnetic field gradient dBx/dx; ii) a second magnetic field gradient dBy/dy; iii) a third magnetic field gradient dBz/dx; iv) a fourth magnetic field gradient dBz/dy; b) determining a first angle α based on at least one of the magnetic field gradients; c) determining a second angle β based on at least one of the magnetic field gradients. A sensor device is configured for performing this method. A sensor system includes such sensor device and a magnet, optionally connected to a joystick.

Device and method for determining an orientation of a magnet, and a joystick

Angular position sensor system comprising: a cylindrical magnet rotatable about a rotation axis; and an angular position sensor device comprising: a substrate comprising a plurality of magnetic sensitive elements configured for measuring a first magnetic field component in a first direction and a second magnetic field component in a second direction perpendicular to the first direction; and a processing circuit configured for calculating the angular position; the sensor device being oriented such that the first direction is oriented in a circumferential direction, and the second direction is either parallel or orthogonal to the rotation axis; the sensor device being located at a predefined position where a magnitude of a third magnetic field component orthogonal to the first and second magnetic field component is negligible over the 360° angular range.

Magnetic sensor device, system and method

A method of determining a linear or angular position of a magnetic sensor device relative to a magnetic source, or vice versa, the sensor device includes at least four magnetic sensor elements. The method involves the steps of: a) determining a first magnetic field gradient; b) determining a second magnetic field gradient; c) determining a ratio of the first and second magnetic field gradient; d) converting the ratio into a position; while matching signal paths of the magnetic sensor elements so as to improve signal-to-noise.

Position sensor devices, methods and systems based on magnetic field gradients

A method of determining a gradient of a magnetic field, includes the steps of: biasing a first/second magnetic sensor with a first/second biasing signal; measuring and amplifying a first/second magnetic sensor signal; measuring a temperature and/or a stress difference; adjusting at least one of: the second biasing signal, the second amplifier gain, the amplified and digitized second sensor value using a predefined function f(T) or f(T, ΔΣ) or f(ΔΣ) of the measured temperature and/or the measured differential stress before determining a difference between the first/second signal/value derived from the first/second sensor signal. A magnetic sensor device is configured for performing this method, as well as a current sensor device, and a position sensor device.

Devices and methods for measuring a magnetic field gradient

A magnetic sensor system includes an integrated circuit comprising a semiconductor substrate. The semiconductor substrate has a plurality of magnetic sensors configured for measuring at least two first magnetic field components oriented in a first direction, and for measuring at least two second magnetic field components oriented in a second direction; a permanent magnet movable relative to the integrated circuit and configured for generating a magnetic field. A processing circuit is configured for determining at least two physical quantities related to a position of the magnet, using a predefined algorithm based on the measured first and second magnetic field components or values derived therefrom, as inputs, and that uses a plurality of at least eight constants which are determined using machine learning. A force sensor system, a joystick or thumbstick system, and a method may use the magnetic sensor system.

Magnetic sensor devices, systems and methods, and a force sensor

A method of determining a gradient of a magnetic field, includes the steps of: biasing a first/second magnetic sensor with a first/second biasing signal; measuring and amplifying a first/second magnetic sensor signal; measuring a temperature and/or a stress difference; adjusting at least one of: the second biasing signal, the second amplifier gain, the amplified and digitized second sensor value using a predefined function f(T) or f(T, &#x394;&#x3a3;) or f(&#x394;&#x3a3;) of the measured temperature and/or the measured differential stress before determining a difference between the first/second signal/value derived from the first/second sensor signal. A magnetic sensor device is configured for performing this method, as well as a current sensor device, and a position sensor device.

Angular position sensor system comprising: a cylindrical magnet rotatable about a rotation axis; and an angular position sensor device comprising: a substrate comprising a plurality of magnetic sensitive elements configured for measuring a first magnetic field component in a first direction and a second magnetic field component in a second direction perpendicular to the first direction; and a processing circuit configured for calculating the angular position; the sensor device being oriented such that the first direction is oriented in a circumferential direction, and the second direction is either parallel or orthogonal to the rotation axis; the sensor device being located at a predefined position where a magnitude of a third magnetic field component orthogonal to the first and second magnetic field component is negligible over the 360&#xb0; angular range.

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Neuchatel, Switzerland

Nicolas Dupre