Stmicroelectronics S.r.l.

Stmicroelectronics International N.v.

Nicola De Campo

Matteo Venturelli

Valerio Bendotti

Matteo Brivio

Carlo Curina

Valerio Gennari Santori

Mauro Foppiani

Provided is a receiver circuit that receives a differential signal including positive and negative spikes. A first comparator produces an intermediate set signal that includes a pulse at each positive spike of the differential signal, and a second comparator produces an intermediate reset signal that includes a pulse at each negative spike of the differential signal. A sensing circuit extracts a common-mode voltage signal from the differential signal and asserts a control signal when the amplitude of the common-mode voltage signal exceeds a threshold. A logic circuit asserts a masking signal for an interval in response to asserting the control signal and de-asserts the masking signal in response to the interval elapsing. The logic circuit produces a corrected set signal. The logic circuit produces a corrected reset signal. An output circuit generates an output signal from the corrected set signal and the corrected reset signal.

Receiver circuit, corresponding isolated driver device, electronic system and method of decoding a differential signal into a digital output signal

A receiver circuit receives a differential signal that includes positive and negative spikes, and produces an output signal as a function of the differential signal. A first comparator produces an intermediate set signal that includes a pulse at each positive spike of the differential signal, and a second comparator produces an intermediate reset signal that includes a pulse at each negative spike of the differential signal. A logic circuit detects whether the digital signal switches between a first value and a second value, and whether the intermediate reset signal and the intermediate set signal include pulses lasting longer than a threshold. The logic produces a set correction signal and a reset correction signal. The logic circuit produces a corrected set signal and a corrected reset signal. An output circuit produces an output signal based on the corrected set signal and the corrected reset signal.

A system for testing is provided. The system includes an electronic circuit and an automatic testing equipment (ATE). The electronic circuit includes a voltage monitor including a resistive divider receiving at its voltage input an input voltage and coupled at its output to an input of a comparator. A reference input of the comparator is coupled to a generator supplying a reference voltage setting one or more thresholds of the comparator. The electronic circuit includes a Built In Self Test Module coupled to the ATE and to the inputs and output of the comparator. The BIST module is being configured upon receiving respective commands from the ATE to test a reaction time of the comparator and an offset of the comparator. The ATE performs a respective test of the ratio of the resistor divider by a first voltage measurement and a test of the reference voltage provided by the generator.

Testing an electronic circuit having a voltage monitor circuit

A system, method, and device to test an electronic circuit are disclosed having a stage to supply a driving signal to a load comprising a pull-up switch and a pull-down switch and a pre-driver stage including pre-driver circuits. The electronic circuit including circuits for testing the pre-driver stage under the control of an automatic testing equipment (ATE) to operate a built-in self-test sequence including test commands for the pre-driver stage under the control of an external test signal issued by the ATE. The system includes a time measuring circuit to measure duration of signals at the output of the stage coupled to a pass-fail check circuit, and to evaluate if the duration of signals at the output of the stage to determine whether the output satisfies a pass criterion.

System for testing an electronic circuit and corresponding method and computer program product

A transmitter circuit receives a PWM input signal and a clock signal. A logic circuit generates a control signal as a function of the clock signal. The control signal is normally set to high, and is periodically set to low for a transmission time interval when an edge is detected in the clock signal. The transmission time interval is shorter than a half clock period of the clock signal. A tri-state transmitter receives the PWM input signal and the control signal, and produces first and a second output signals at first and second transmitter output nodes, respectively. The output signals have a voltage swing between a positive voltage and a reference voltage. An output control circuit is sensitive to the control signal and is coupled to the first and second transmitter output nodes.

Transmitter circuit, corresponding isolated driver device, electronic system and method of encoding a pulse-width modulated signal into a differential pulsed signal

A configurable voltage regulating circuit includes first through fourth switches. A flying capacitor is coupled between a common mode node and a pump node, and a sense resistance network is coupled between an output node and an input of an error amplifier and configured to provide a sensed output voltage. The error amplifier receives at another input a reference voltage and generates an error signal. A charging circuit supplies a charging current to the pump node, and controls the value of the charging current as a function of the error signal. A switch command signals generator generates respective first, second, third, and fourth switch signals to control the first switch, second switch, third switch, and fourth switch. The generator sets the configurable voltage regulating circuit as either a charge pump or a linear regulator based the input voltage being less than a first threshold or greater than a second threshold.

Circuit arrangement for regulating a voltage, corresponding system and method

In an embodiment a method for testing a digital electronic circuit includes coupling an external test equipment to a digital electronic circuit in order to apply an external voltage signal to the digital electronic circuit when an automatic test pattern generation (ATPG) procedure with a given test pattern is performed, wherein a value of the external voltage signal is controlled by the external test equipment and measuring, at the external test equipment, the digital supply voltage at an output of the voltage regulator and at an input of the internal digital circuitry, wherein the external voltage signal is applied to the differential inputs of the op-amp voltage regulator through an adaptation circuit to obtain determined values of the digital supply voltage.

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Cura Carpignano, Italy

Nicola De Campo