General Electric Company

Unisyn Medical Technologies, Inc.

Nickolas Markoff

Christopher M Cone

Mike M Tesic

Systems and methods (the 'utility') presented herein provide for the assessment of acousto-electrical probes, such as their connections (e.g., transducer leads) and their response characteristics. For example, the utility may provide for readily evaluating transducer leads that have been broken and/or detached from transducers within an ultrasound probe. Due to the increasing complexity of ultrasound probes, identification of broken and/or detached transducer leads also becomes increasingly complex. Being able to identify such disconnected transducer leads may enable a person to repair, or 'reterminate', these transducer leads leading to a potentially substantial cost savings, the least of which being incurred by avoiding total replacement of an ultrasound probe.

Systems and methods for reconfiguring an ultrasound device

Systems and methods disclosed herein provide for the assessment of acousto-electrical probes, such as their connections (e.g., transducer leads) and their response characteristics. An example method of determining a capacitance capability of an electrical lead for an ultrasound device includes discharging stored capacitance of the electrical lead; applying power to the electrical lead; during applying power to the electrical lead, counting clock cycles from a microprocessor; comparing a electrical lead voltage to a reference voltage; stopping counting clock cycles when the electrical lead voltage passes the reference voltage; and processing a number of counted clock cycles, in response to stopping the counting clock cycles to determine a capacitance of the electrical lead.

Ultrasound device testing

Systems and methods presented herein provide for the testing and reconfiguration of x-ray devices. In one embodiment, a test bed effectuates testing of an acquired x-ray device to determine a cause of the inoperability of the device. The x-ray device test bed may be provided to test a plurality of x-ray devices and, therefore, readily adaptable to such devices. The x-ray device test bed may include a mount for an x-ray tube. A variable power supply may be coupled to the x-ray tube to provide the requisite high-voltage electrical energy thereto. The x-ray device test bed may also include a mount for an imaging module (e.g., a 'flat-panel sensor'). A processor may be coupled to the imaging module to determine the operational characteristics thereof. If certain x-ray components are deemed inoperable, the x-ray components may be replaced such that the x-ray device may be reintroduced to a medical industry segment.

Growing community of inventors

Golden, CO, United States of America

Nickolas Markoff