Micron Technology Incorporated

Nick Labrum

Paul A Silvestri

Bryce D Cook

One or more embodiments of the present invention reduce uneven degradation during testing by providing for a toggling signal to be applied to remaining input paths which do not receive test signals. Therefore, rather than being held in a fixed state during the burn-in process, the remaining inputs are toggled as well. Consequently, they degrade at a more similar rate as their counterpart inputs that did receive test signals.

Methods, devices, and systems for experiencing reduced unequal testing degradation

The illustrated embodiments relate to a control circuit that is adapted to use a latency signal to generate an output signal. The latency is adapted to be used to create a control signal that is dependent on the latency signal. The control signal is adapted to be used to select from among multiple input sources. The selected input source is adapted to be used to create an output signal.

Apparatus for latency specific duty cycle correction

The illustrated embodiments relate to a control circuit that uses a latency signal to generate an output signal. The latency is used to create a control signal that is dependent on the latency signal. The control signal is used to select from among multiple input sources. The selected input source is used to create an output signal.

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Boise, ID, United States of America

Nick Labrum