Cirrus Logic Inc.

Wolfson Microelectronics Limited

Nicholas Roche

Anthony Stephen Doy

Itisha Tyagi

Ricky Wong

William Brian Fallon

Ian Bowman Brockbank

Martin David Twigg

A method of fabricating a piezoelectric transducer may include interleaving a plurality of layers of piezoelectric material with a plurality of conductive layers including a first conductive layer, one or more second conductive layers, and one or more third conductive layers, coupling the first conductive layer to a first electrode, wherein an electrical impedance of the first conductive layer varies as a function of a temperature internal to the piezoelectric transducer, and such that a measurement signal indicative of the electrical impedance is generated at the first electrode, coupling the one or more second conductive layers to a second electrode, and coupling the one or more third conductive layers to a third electrode, such that an electrical driving signal driven to the second electrode and the third electrode causes mechanical vibration of the piezoelectric transducer as a function of the electrical driving signal.

Fabrication of piezoelectric transducer including integrated temperature sensor

An apparatus is provided for monitoring and controlling a device under test, the device under test comprising a plurality of registers, each register having a register value and comprising a plurality of data bits for controlling a setting or settings of the device under test. The apparatus comprises display means for displaying an interactive register map to a user. The interactive register map is configured to display a plurality of register values simultaneously, and further adapted to display one or more data fields corresponding to each register value, each data field relating to one or more of the data bits and having a first indicator for representing a corresponding device setting. In this manner, a user can readily appreciate which device settings are controlled by the same register value, and hence can be written simultaneously.

Apparatus and method for monitoring and controlling a device under test

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Edinburgh, United Kingdom

Nicholas Roche