Renishaw Plc

Nicholas John Weston

Geoffrey McFarland

David R McMurtry

Yvonne Ruth Huddart

Geoff McFarland

Kenneth Cheng-Hoe Nai

Kevyn Barry Jonas

Stephen James Trull

Ian William McLean

Ben Ian Ferrar

Colin Ray Bulled

Marcus Ardron

Kenneth Cheng Hoe Nai

Andrew John Moore

James Fergus Robertson

James Reynolds Henshaw

Robert R Thomson

Leo Christopher Somerville

Matthew Henry Freeman

Martin Simon Rees

Timothy Charles Featherstone

John Dardis

Kenneth C-h Nai

Duncan Paul Hand

Alexander David McKendrick

Richard George Dewar

Matthew Donald Kidd

Stephanie Giet

Kenneth C H Nai

David Roberts Mcmurtry

Geoffrey Mcfarland

John Peter Carr

Kenneth Nai

Alexander David Mckendrick

Marc Philippe Yves Desmulliez

Ian William Mclean

Derryck Telford Reid

Hollie Wright

This invention concerns an additive manufacturing apparatus for building objects by layerwise consolidation of material. The apparatus comprises a build chambercontaining a working area, a plurality of high energy beamsfor consolidating material deposited in the working area in layers and an optical unitfor controlling transmission of the high energy beams onto material in the working area. The optical unitcomprises a plurality of independently controllable optical elementseach optical elementfor controlling transmission of at least one of the high energy beams onto the material in the working area, the optical unitmovable in the build chamber

Additive manufacturing apparatus and method

A method of putting a feature of interest on an object and an optical inspection system of a non-contact probe mounted on a positioning apparatus in a desired relationship. The method includes: a) identifying a target point of interest on the object to be inspected by arranging the non-contact probe and object at a first relative configuration at which a marker feature, projected by the non-contact probe along a projector axis that is not coaxial with the optical inspection system's optical axis, identifies the target point of interest; and b) subsequently moving the non-contact probe and/or object so as to put them at a second relative configuration at which the target point of interest and optical inspection system are at the desired relationship, in which the positioning apparatus is configured to guide such motion in accordance with the control path.

Non-contact probe and method of operation

An additive manufacturing apparatus for building objects by layerwise consolidation of material. The apparatus includes a build chamber containing a working area, a plurality of high energy beams for consolidating material deposited in the working area in layers and an optical unit for controlling transmission of the high energy beams onto material in the working area. The optical unit includes a plurality of independently controllable optical elements each optical element for controlling transmission of at least one of the high energy beams onto the material in the working area, the optical unit movable in the build chamber.

A method of forming an optical device comprises applying a laser beam to a target area of the surface so as to selectively heat material of the surface thereby to provide transfer of material due to a surface tension gradient, wherein the surface is such that, when liquid, parts of the surface at higher temperatures have a higher surface tension than adjacent parts of the surface at lower temperatures.

Method of forming an optical device

A measurement scale device includes at least one scale marking, wherein the or each scale marking includes at least one periodic nanostructure that represents scale device information.

Measurement scale with periodic nanostructure

An optical inspection probe for obtaining and providing images of an object to be inspected. The optical inspection probe comprises an imaging assembly for capturing an image of an object and an illumination assembly for producing a light beam directed toward the object. The optical inspection probe is configured such that the light beam converges to a focal point at a first focal plane.

Optical inspection probe

A non-contact measurement apparatus and method. A probe is provided for mounting on a coordinate positioning apparatus, comprising at least one imaging device for capturing an image of an object to be measured. Also provided is an image analyzer configured to analyze at least one first image of an object obtained by the probe from a first perspective and at least one second image of the object obtained by the probe from a second perspective so as to identify at least one target feature on the object to be measured. The image analyzer is further configured to obtain topographical data regarding a surface of the object via analysis of an image, obtained by the probe, of the object on which an optical pattern is projected.

Non-contact probe

A non-contact method of inspecting the topography of an area of an object via analysis of the phase of a pattern projected on the object. The method includes taking a first image of the object, obtained from a first perspective, on which an optical pattern is projected, and taking a second image of the object, obtained from a second perspective, on which an optical pattern is projected but in which the optical pattern, as it falls on the object, in the second image differs to that in the first image. The method further includes determining data describing the topography of at least a region of the object based on phase data relating to the phase of at least a region of the optical pattern as imaged in the first image. Phase data obtained from a corresponding region of the object as imaged in the second image is used to resolve any ambiguity in the phase or topography data obtained from the first image.

Non-contact object inspection

A method of operating a coordinate positioning apparatus comprising an articulated head having at least one rotational axis. The method comprises, in any suitable order, loading at least one interchangeable task module onto the articulated head; and loading at least one interchangeable task module counterweight on the articulated head. The at least one interchangeable task module counterweight at least partially counterbalances the weight of the at least one task module on the articulated head about the at least one axis.

Interchangeable task module counterweight

A measurement system has a surface sensing device mounted on an articulating probe head, which in turn is mounted on a coordinate positioning apparatus. The surface sensing device is moved relative to a surface by driving at least one of the coordinate positioning apparatus and probe head in at least one axis to scan the surface. The surface sensing device measures its distance from the surface and the probe head is driven to rotate the surface sensing device about at least one axis in order to control the relative position of the surface sensing device from the surface to within a predetermined range in real time.

Probe head for scanning the surface of a workpiece

A method of calibrating an articulating probe head comprising the steps of measuring an artifact of known dimensions with the workpiece sensing probe mounted on the articulating probe head, in which the articulating probe head is unlocked. An error functional map is generated corresponding to the difference between the measured and known dimensions of the artifact. Subsequent workpieces are measured with the articulating probe head unlocked and the corresponding correction applied. The true dimensions of the artifact may be determined by measuring it with a probe mounted on an articulating probe head in which the axes of the articulating probe head are locked. A mechanical lock is provided to lock the axes of the articulating probe head.

Calibration artefact for calibrating an articulating probe head

A non-contact method and apparatus for inspecting an object. At least one first image of the object on which an optical pattern is projected, taken from a first perspective is obtained. At least one second image of the object on which an optical pattern is projected, taken from a second perspective that is different to the first perspective is obtained. At least one common object feature in each of the at least one first and second images is then determined on the basis of an irregularity in the optical pattern as imaged in the at least one first and second images.

Non-contact measurement apparatus and method

A non-contact method and apparatus for inspecting an object via phase analysis. A projector projects an optical pattern onto the surface of an object to be inspected. At least first and second images of the surface on which the optical pattern is projected are then obtained. The phase of the optical pattern at the surface is changed between the first and second image by moving the projector relative to the object.

Phase analysis measurement apparatus and method

Apparatus for a co-ordinate positioning machine is described that comprises an articulating probe head for supporting a measurement probe. The articulating probe head comprises at least one electric motor. Heating means are provided for generating heat in the articulating probe head. The heating means may be the motors or discrete heating elements. Temperature sensing means, such as one or more temperature sensors, is also provided for determining the temperature at the articulating probe head. The apparatus allows the temperature of the articulating probe head to be controlled.

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Peebles, United Kingdom

Nicholas John Weston