Texas Instruments Corporation

Nicholas H Schutt

Karl Friedrich Greb

Henry Nguyen

James Michael Jarboe, Jr

Bibo Chen

A video output supervisor includes a test region indicator for verifying that the commanded output to specific areas of a display is valid. Areas reserved displaying safety-critical data in the data frame to be displayed can be supervised for the presence and status of display indicators of the safety-critical data. The confidence of the supervision can be increased by measuring other display and frame parameters in conjunction with supervising the indicators of the safety-critical data.

Video output supervisor

An error monitor receives a first list of selected system events with each selected system event having an associated range. The occurrence of each selected system event is counted over a selected time period. An error indication is provided based on a comparison of each of the counts of the occurrence of each selected system event over the selected time period with the associated range. Operational profiles are used to store lists of selected system events with each selected system event having an associated range for each operational profile.

Event monitor having switch matrix, separate counter, and compare circuitry

A CPU-based systemand method for testing embedded memory. The technique employs the on-chip CPUitself to test the embedded memoryAn assembly code program is loaded into the device under test (DUT)to test the memories, determine a repair solution, and write out the repair solution and raw failure information to the tester for defect analysis. The test is driven by an external programmable clock that is provided by the tester to allow the DUTto run up to its maximum input clock rate in order to maximize throughput. The test is not dependent on the pattern rate of the tester.

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Villeneuve-Loube, France

Nicholas H Schutt