Other

Bio-Rad Laboratories, Inc.

Zygo Corporation

Nicholas Doe

Daniel Y Chu

David James Ray

Vishal Khosla

Gautam Char

Robert Archer

Frank Hsiung

Michael Vinogradov-Nurenberg

Teresa Rubio

Amber Iraeta

Kelly Kroeger

Veronika Kortisova

Emmanuel Quiroz

Zuo Cheng Shen

Terence Rogers Lundy

The present invention relates in general to microscopy systems. In particular, the present invention relates to microscopes rendering digital images of samples, with the capability to digitally control the focus of the microscope system, and the software used to control the operation of the digital microscope system. Further, the present invention relates to a microscope structure that allows for compact and multi-functional use of a microscope, providing for light shielding and control with samples that require specific light wavelength characteristics, such as fluorescence, for detection and imaging.

Adjustable digital microscope display

Proposed is a universal mechanical tester for measuring friction and wear characteristics of materials. The tester allows performing multiple test protocols with a single machine. The tester consists of a frame that supports a carriage moveable in a vertical direction, a force sensor assembly attached to the carriage, a positioning stage with a slide and a platform, and a plurality of modular sample stages interchangeably installable on the platform for executing linear and rotary motions of the lower sample relative to the upper sample in various directions and planes. The tester is provided with a set of electronic identification devices for identifying a modular sample stage installed on the platform and the force sensor assembly attached to the carriage.

Universal mechanical tester for measuring friction and wear characteristics of materials

A combination confocal and scanning probe microscope system permits accurate location of a sample within the field of view as the sample translates from one type of microscope to the other. Alternate embodiments permit both microscopes to view the same sample location at the same time. Further alternate embodiments include a confocal and a probe microscope integrated into a common optical path.

Integrated scanning probe microscope and confocal microscope

A method for estimating a property of a selected feature on a photolithographic mask includes providing a model of an image-acquisition system. The model includes information indicative of the characteristics of the image-acquisition system. The image-acquisition system is used to obtain a measured signal representative of the selected feature. On the basis of the measured signal, and the information provided by the model, a value of the property is estimated for the selected feature.

Measurement of photolithographic features

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San Ramon, CA, United States of America

Nicholas Doe