Micron Technology Incorporated

Niccolo′ Righetti

Kishore Kumar Muchherla

Giuseppina Puzzilli

Jeffrey S McNeil, Jr

Mark Alan Helm

Akira Goda

Gil Golov

Jeremy Binfet

Todd A Marquart

Carmine Miccoli

Scott Anthony Stoller

Pitamber Shukla

Priya Venkataraman

Vamsi Pavan Rayaprolu

Ashutosh Malshe

Jonathan Scott Parry

Jung Sheng Hoei

Karl David Schuh

Ugo Russo

Nicola Ciocchini

Animesh Roy Chowdhury

Sivagnanam Parthasarathy

Mustafa Nazmi Kaynak

James Fitzpatrick

Emilio Camerlenghi

Sara Vigano

A system includes a memory device including multiple memory cells and a processing device operatively coupled to the memory device. The processing device is to receive a first read command at a first time. The processing device is further to receive a second read command at a second time. The processing device is further to determine that the first read command and the second read command are directed to an at least partially same set of memory cells of the plurality of memory cells. The processing device is further to perform a media management operation with respect to the at least partially same set of memory cells.

Modified read counter incrementing scheme in a memory sub-system

Apparatuses, systems, and methods for adapting a read disturb scan. One example method can include determining a delay between a first read command and a second read command, incrementing a read count based on the determined delay between the first read command and the second read command, and adapting a read disturb scan rate based on the incremented read count.

Adaptive read disturb scan

A method includes determining, by a processing device, a value of a memory endurance state metric associated with a segment of a memory device in a memory sub-system; determining a target value of a code rate based on the value of the memory endurance state metric, and adjusting the code rate of the memory device according to the target value, wherein the code rate reflects a ratio of a number of memory units designated for storing host-originated data to a total number of memory units designated for storing the host-originated data and error correction metadata.

Adjustment of code rate as function of memory endurance state metric

A system includes a processing device and a memory device communicatively coupled to the processing device. The memory device can include a cyclic buffer partition portion and a snapshot partition portion coupled to the cyclic buffer partition portion via hold-up capacitors. The snapshot partition portion can further include a first sub-partition portion having a first programming characteristic and a second sub-partition portion having a second programming characteristic. The processing device can write received data sequentially to the cycle buffer partition portion and write, based at least in part on a determination that a trigger event has occurred, data from the cyclic buffer partition portion to the first sub-partition portion or the second sub-partition portion, or both.

Partitions within snapshot memory for buffer and snapshot memory

A method is described that includes determining a number of program and erase cycles associated with a block of pages of a memory device and determining a preprogram voltage based on the number of program and erase cycles to apply to the block of pages prior to an erase operation. The method further includes applying the preprogram voltage to the block of pages and performing an erase operation on the block of pages following application of the preprogram voltage to the block of pages.

Adjusting a preprogram voltage based on use of a memory device

A method includes writing received data sequentially to a particular location of a cyclic buffer of a memory device according to a first set of threshold voltage distributions. The method further includes performing a touch up operation on the particular location by adjusting the first set of threshold voltage distributions of the data to a second set of threshold voltage distributions in response to a determination that a trigger event has occurred. The second set of threshold voltage distributions can have a larger read window between adjacent threshold voltage distributions of the second set than that of the first set of threshold voltage distributions.

Threshold voltage distribution adjustment for buffer

A method includes performing a copyback operation comprising transferring, using an internal processing device, user data and header data corresponding to the user data from a first block of memory in a memory device to a register in the memory device, decoupling the user data from the header data, performing an error correction code (ECC) operation on updated header data using an external processing device, transferring, via the external processing device, the updated header data to the register, and transferring the user data and the updated header data from the register to a second block of memory in the memory device.

Data management during a copyback operation

A memory component comprises a cyclic buffer partition portion and a snapshot partition portion. In response to receiving a signal that a trigger event has occurred, a processing device included in the memory component performs an error correction operation on a portion of data stored in the cyclic buffer partition portion, copies the data stored in the cyclic buffer partition portion to the snapshot partition portion in response to the error correction operation being successful, and sends the data stored in the cyclic buffer partition portion to a processing device operatively coupled to the memory component in response to the error correction operation not being successful.

Partitioned memory having error detection capability

A method and system for temperature-dependent operations in a memory device are described. Temperature measurements of a memory device are recorded. A determination that a temperature measurement of the memory device satisfies a threshold temperature value is performed. In response to the determination, execution of a background operation in the memory device is delayed, and host system operation(s) continue to be executed in the memory device while execution of the background operation is delayed.

Temperature-dependent operations in a memory device

A method is described that includes performing a first erase operation on a set of memory cells of a memory device using an erase voltage, which is set to a first voltage value and adjusting the erase voltage to a second voltage value based on feedback from performance of at least the first erase operation. The method further includes performing a second erase operation on the set of memory cells using the erase voltage, which is set to the second voltage value. In this configuration, the erase voltage set to the second voltage value is an initial voltage applied to the set of memory cells to perform erase operations such that each subsequent erase operation on the set of memory cells following the first erase operation uses an erase voltage that is equal to or greater than the second voltage value when erasing the first set of memory cells.

Setting an initial erase voltage using feedback from previous operations

A change in a read window of a group of memory cells of a memory device that has undergone a plurality of program/erase cycles (PECs) can be determined. read voltage can be determined based at least in part on the determined change in the read window.

Determining a read voltage based on a change in a read window

A signal associated with performance of a memory operation can be applied to a memory cell of a first group of memory cells that have undergone PECs within a first range. The signal can have a first magnitude corresponding to a second range of PECs. Whether differences between a first target voltage and the signal and between a second target voltage and the applied signal are at least the threshold value can be determined. Responsive to determining that the differences are at least the threshold value, the first group of memory cells can be associated with a first calibration cluster and the signal having a second magnitude corresponding to a third range of PECs can be applied to a memory cell of a second group of memory cells that have undergone respective quantities of PECs within the second range.

Read calibration based on ranges of program/erase cycles

A system includes a processing device and a memory device coupled to the processing device. The memory device can include a cyclic buffer portion and a snapshot portion. The processing device can store time based telemetric sensor data in the cyclic buffer portion, copy an amount of the telemetric sensor data from the cyclic buffer portion to the snapshot portion in response to a trigger event, operate the cyclic buffer portion with a first trim tailored to a performance target of the cyclic buffer portion, and operate the snapshot portion with a second trim tailored to a performance target of the snapshot portion.

Separate trims for buffer and snapshot

Some embodiments include methods of forming memory arrays. An assembly is formed which has an upper level over a lower level. The lower level includes circuitry. The upper level includes semiconductor material within a memory array region, and includes insulative material in a region peripheral to the memory array region. First and second trenches are formed to extend into the semiconductor material. The first and second trenches pattern the semiconductor material into a plurality of pedestals. The second trenches extend into the peripheral region. Contact openings are formed within the peripheral region to extend from the second trenches to the first level of circuitry. Conductive material is formed within the second trenches and within the contact openings. The conductive material forms sense/access lines within the second trenches and forms electrical contacts within the contact openings to electrically couple the sense/access lines to the lower level of circuitry.

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Boise, ID, United States of America

Niccolo′ Righetti