Micron Technology Incorporated

Niccolo Izzo

Robert Michael Walker

Sujeet V Ayyapureddi

Ameen D Akel

Yang Lu

Cagdas Dirik

Markus H Geiger

Edmund Gieske

Elliott C Cooper-balis

Danilo Caraccio

An energy-efficient and area-efficient, mitigation of errors in a memory media device that are caused by row hammer attacks and the like is described. The detection of errors is deterministically performed while maintaining, in an SRAM, a number of row access counters that is smaller than the total number of rows protected in the memory media device. The reduction of the number of required counters is achieved by aliasing a plurality of rows that are being protected to each counter. The mitigation may be implemented on a per-bank basis, per-channel basis or per-memory media device basis. The memory media device may be DRAM.

Aliased row hammer detector

Growing community of inventors

Boise, ID, United States of America

Niccolo Izzo