Nvidia Corporation

Nerinder Singh

Gunaseelan Ponnuvel

Craig Nishizaki

Hemant Kumar

Luai Nasser

Dushyant Narayen

An IDDQ test system and method that, in one embodiment, includes 1) an empirical extraction subsystem operable to generate an IDDQ versus temperature model for a given semiconductor device design, 2) an automatic test equipment (ATE) test subsystem operable to obtain a measured IDDQ value (IDDQ) at a measured temperature (T) for a specific semiconductor device embodying the given semiconductor device design, the measured temperature (T) obtained within 5 seconds of obtaining the measured IDDQ value (IDDQ), and 3) a scaling subsystem operable to scale the measured IDDQ value (IDDQ) at the measured temperature (T) to a compensated IDDQ value (IDDQ) at a desired temperature (T) using the IDDQ versus temperature model.

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San Jose, CA, United States of America

Nerinder Singh