University of Michigan

Neil M Cole

Robert G Dennis

A Michelson interferometer is used to determine the displacement of a force loaded member, the loaded member having a reflective surface applied thereto to reflect light back to a beam splitter in the interferometer apparatus. Light is also reflected back from a reflective surface attached to a stationary member. The interaction of the reflected light from the movable and stationary member interacts to form an interference fringe pattern which may be used to determine the amount of displacement and, therefor, the force applied to the loaded member. The apparatus is comprised of a material which is substantially resistive to thermal deformation.

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Ann Arbor, MI, United States of America

Neil M Cole