Ibex Innovations Limited

Neil Loxley

Paul Scott

Adam Ratcliffe

Gary Gibson

A method of performing scatter correction on an X-ray image is disclosed. The method comprises obtaining an input image for processing based on a source X-ray image of a sample acquired using an X-ray detector, and determining a model of the sample based on the input image. The model is then evaluated by computing, based on the model, simulated X-ray image data and evaluating the simulated image data against the input image to determine whether a convergence criterion is fulfilled. An updated model of the sample is generated if the convergence criterion is not fulfilled. The model evaluating step is repeated based on one or more successive updated models until the convergence criterion is fulfilled in a final iteration, and scatter correction is then performed on the source X-ray image using simulated image data computed during the final iteration.

X-ray imaging system

An x-ray imaging method comprises the steps of: providing a set of at least one training material, the set comprising different materials and/or different thicknesses of the or each material; obtaining observed x-ray images of the at least one training material with a pixellated detector; building a database in a simulator of simulated scatter kernels for variable parameters within the simulator for each of the at least one training material; generating a transfer function between parameters of the simulator and parameters of the observed image which is independent of sample type and thickness; generating a whole image scatter estimate; predicting the direct radiation for each scatter kernel; applying the transfer function to the scatter estimate and the direct radiation or the inverse of the transfer function to the observed intensity values; performing the calculation Z&#x2212;S&#x2212;D&#x3c;threshold to provide scatter free data and/or a scatter free image.

Apparatus and method for the correction of scatter in a radiographic system

An x-ray apparatus comprises an x-ray source and an x-ray detector and there between a member that is configured to perturb x-ray photons incident thereon. The apparatus further comprises a first database of values representative of material type and material thicknesses, a second database of scatter radiation values indicative of material type and/or material thicknesses, a processor configured to perform an algorithm which compares the output signal of the x-ray detector with values in the first database and to output a most likely material and/or thickness from the first database; selects from the second database the scatter radiation associated with the material type and/or material thickness; and removes the scatter radiation from an output signal of the x-ray detector.

Growing community of inventors

Sedgefield, United Kingdom

Neil Loxley