Tektronix, Inc.

Neil C Clayton

Marc A Gessford

Karl A Rinder

Chris A Valentine

Steve U Reinhold

Michael J Wadzita

Jessica Anna Dunn

David M Ediger

Taylor S K Heen

Prashanth Thota

Brian A Hollenberg

Satya N Whitlock

Lawrence M Le Mon

Stanley G Miller

Thuy T Nguyen

Samuel A Cassel

Michael C Moore

Richard A Booman

Jonah S Griffith

Robert R Kreitzer

J Steven Lyford

Gary J Waldo

Aaron J Piazza

Bruce Clinton Tollbom

Edward Larry Alexander, Jr

Domenic Anthony Lopresti

David Skoog

Battery accessory for a test and measurement instrument

Test and measurement instrument with stand and battery

Test and measurement instrument and accessories

Housing for a test and measurement instrument

An electrical connector including a main body, a base portion, and a tapered end. The electrical connector extends axially in a first direction and an opposite second direction. The main body is configured to connect to an electrical cable. The base portion abuts the main body at a first end of the base portion and has an outer shoulder at a second end of the base portion. The tapered end extends and tapers from the outer shoulder in the second direction. The tapered end includes a plurality of resilient fingers separated by slots. The fingers extend away from the base portion in the second direction to a distal end of the fingers. The slots extend radially through the tapered end. The slots further extend axially in the first direction from the distal end through the outer shoulder.

Reduced stress electrical connector

Stacking system support for electronic equipment

Stacking system for electronic equipment

The resistive probing tip system has one or more carriers and one or more electrical contact assemblies. Each carrier has opposing surfaces with a plurality of resistors engaging the carrier. Each of the plurality of resistors has opposing electrical contacts that are exposed at respective opposing surfaces of the carrier. Each electrical contact assembly has opposing surfaces with electrical contacts exposed at the opposing surfaces with each electrical contact exposed on one surface coupled to a corresponding electrical contact on the other opposing surface. The carrier(s) and the electrical contact assembly(s) selectively mate to and mate from one another with the electrical contacts exposed at the opposing surfaces the carrier(s) and the electrical contact assembly(s) contacting one another. The carrier(s) and/or the electrical contact assembly(s) may be selectively secured to either of a circuit board or a probe head.

Resistive probing tip system for logic analyzer probing system

A connector has a housing with an aperture formed therein having one portion larger than the other portion. The housing is mounted on the device under test with the housing positioned over a plurality of electrical contacts. An electrical load is positioned within the larger aperture of the housing and has a plurality of resistors disposed adjacent to an electrical contact assembly. A resilient member is positioned between the electrical load and the device under test such that a force directed on the electrical load compresses the resilient member to allow contact between a plurality of electrical contacts of the electrical contact assembly and the plurality of the electrical contacts on the device under test. Removing the force decompresses the resilient member and disconnects the plurality of contacts of the electrical contact assembly from the plurality of electrical contacts of the device under test.

Connector for selectively coupling an electrical load to a device under test

An electrical contact assembly has a plurality of formed elongate closed seam tubular elements attached to a carrier with each of the elongate tubular elements attached to the carrier via a tab. Scored creases are formed in the tabs for separating the elongate tubular elements from the assembly and scored creases are formed in the carrier for defining carrier strips. The carrier strip had a plurality of grouped elongate tubular elements. The electrical contact assembly is placed in a crimping die where at least one or more wires are inserting into selected elongate tubular elements. Pressure is applied to least one or more of the selected elongate tubular elements to produce bulk material deformation along a substantial portion of the elongate tubular elements to crimp the elongate tubular elements to the wires as electrical contacts.

Method of manufacturing an electrical contact assembly

Growing community of inventors

Hillsboro, OR, United States of America

Neil C Clayton