Stmicroelectronics International N.v.

Neha Bhargava

Ankur Bal

Anupam Jain

Chandrajit Debnath

A polyphase decimation FIR filter apparatus including a modulo integrator circuit configured to integrate input samples and to provide integrated input samples; and a polyphase FIR filter circuit configured to process the integrated input samples, the polyphase FIR filter circuit including a plurality of multiplier accumulator circuits, each configured to accumulate products of coefficients and respective integrated signal samples, wherein each of the multiplier accumulator circuits receives a subset of FIR filter coefficients, wherein the FIR filter coefficients are derived as the nth difference of original filter coefficients, where n is a number of integrators in the integrator circuit, and wherein the FIR filter circuit is configured to perform computation operations with modulo arithmetic.

Decimation FIR filters and methods

Polyphase decimation FIR filters and methods

A built-in self-test (BIST) circuit is provided for testing an analog-to-digital converter (ADC). A multi-order sigma-delta (&#x3a3;&#x394;) modulator has an input that receives an input signal, a first output generating analog test signal derived from the input signal and applied to an input of the ADC and a second output generating a binary data stream. A digital recombination and filtering circuit has a first input that receives the binary data stream and a second input that receives a digital test signal output from the ADC in response to the analog test signal. The digital recombination and filtering circuit combines and filters the binary data stream and digital test signal to generate a digital result signal including a signal component derived from an error introduced by operation of the ADC. A correlation circuit is used to isolate that error signal component.

Apparatus for built-in self-test (BIST) of a Nyquist rate analog-to-digital converter (ADC) circuit

A sigma delta analog-to-digital converter includes a sigma delta modulator including a segmented digital-to-analog converter (DAC), the segmented DAC including a coarse DAC and a fine DAC, wherein the sigma delta modulator is configured to generate a coarse quantized signal and a fine quantized signal; recombination logic configured to combine the coarse quantized signal and the fine quantized signal; and a calibration circuit, operable in a calibration mode, to calibrate the recombination logic to compensate for mismatch between the coarse DAC and the fine DAC of the segmented DAC.

Methods and apparatus for offline mismatch removal in sigma delta analog-to-digital converters

A signal processor includes one or more memory banks, wherein each memory bank stores filter coefficients; and one or more coefficient multiplexer units; each coefficient multiplexer unit being associated with a memory bank, and retrieves a filter coefficient based on a number of received input samples. The processor includes one or more multiply and accumulate (MAC) units, each MAC unit being associated with a coefficient multiplexer unit and determines a product of the retrieved filter coefficient with an input sample; retrieves a previous value stored in an associated register; computes a summation of the previous value and the product; and stores the summation in the associated register. The processor includes an output multiplexer unit to select a register, and to provide a value stored in the register as an output.

Apparatus for signal processing

In an embodiment, a set of input samples are filtered to provide a set of filtered samples using an N-tap filter. A steady-state-response-output sample of the N-tap filter is determined from a N/2th sample of the set of filtered samples.

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Greater Noida, India

Neha Bhargava